scholarly journals In situ study of the role of substrate temperature during atomic layer deposition of HfO2 on InP

2013 ◽  
Vol 114 (15) ◽  
pp. 154105 ◽  
Author(s):  
H. Dong ◽  
Santosh, K.C. ◽  
X. Qin ◽  
B. Brennan ◽  
S. McDonnell ◽  
...  
2012 ◽  
Vol 30 (1) ◽  
pp. 01A143 ◽  
Author(s):  
Krzysztof Kolanek ◽  
Massimo Tallarida ◽  
Marcel Michling ◽  
Dieter Schmeisser

2019 ◽  
Vol 11 (29) ◽  
pp. 26277-26287 ◽  
Author(s):  
Jakob Kuhs ◽  
Andreas Werbrouck ◽  
Natalia Zawacka ◽  
Emile Drijvers ◽  
Philippe F. Smet ◽  
...  

Nanoscale ◽  
2020 ◽  
Vol 12 (21) ◽  
pp. 11684-11693
Author(s):  
Eduardo Solano ◽  
Jolien Dendooven ◽  
Ji-Yu Feng ◽  
Philipp Brüner ◽  
Matthias M. Minjauw ◽  
...  

Supported Pt nanoparticle stabilization via Atomic Layer Deposition overcoating with Al2O3 has been proved to prevent particle coarsening during thermal annealing for widely spaced nanoparticles while ensuring surface accessibility for applications.


2013 ◽  
Vol 102 (17) ◽  
pp. 171602 ◽  
Author(s):  
H. Dong ◽  
B. Brennan ◽  
D. Zhernokletov ◽  
J. Kim ◽  
C. L. Hinkle ◽  
...  

2021 ◽  
Author(s):  
Matthias Marcus Minjauw ◽  
Ji-Yu Feng ◽  
Timo Sajavaara ◽  
Christophe Detavernier ◽  
Jolien Dendooven

In this work, the use of ruthenium tetroxide (RuO4) as a co-reactant for atomic layer deposition (ALD) is reported. The role of RuO4 as a co-reactant is twofold: it acts...


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