Note: Characterization of a high-photon-energy X-ray imager

2013 ◽  
Vol 84 (10) ◽  
pp. 106103 ◽  
Author(s):  
M. Storm ◽  
B. Eichman ◽  
Z. Zhong ◽  
W. Theobald ◽  
P. Schiebel ◽  
...  
Keyword(s):  
Photon Energy ◽  
High Photon Energy ◽  
X Ray

scholarly journals Characterization of an in-vacuum PILATUS 1M detector

2014 ◽  
Vol 21 (3) ◽  
pp. 529-536 ◽  
Author(s):  
Jan Wernecke ◽  
Christian Gollwitzer ◽  
Peter Müller ◽  
Michael Krumrey
Keyword(s):  
Energy Range ◽  
Momentum Transfer ◽  
Photon Energy ◽  
Small Angle ◽  
Grazing Incidence ◽  
Light Elements ◽  
X Ray ◽  
X Ray Scattering ◽  
Pixel Pitch

A dedicated in-vacuum X-ray detector based on the hybrid pixel PILATUS 1M detector has been installed at the four-crystal monochromator beamline of the PTB at the electron storage ring BESSY II in Berlin, Germany. Owing to its windowless operation, the detector can be used in the entire photon energy range of the beamline from 10 keV down to 1.75 keV for small-angle X-ray scattering (SAXS) experiments and anomalous SAXS at absorption edges of light elements. The radiometric and geometric properties of the detector such as quantum efficiency, pixel pitch and module alignment have been determined with low uncertainties. The first grazing-incidence SAXS results demonstrate the superior resolution in momentum transfer achievable at low photon energies.

Fundamental Techniques for High Photon Energy Stability of a Modern Soft X-ray Beamline

2007 ◽  
Author(s):  
Yasunori Senba ◽  
Haruhiko Ohashi ◽  
Hikaru Kishimoto ◽  
Takanori Miura ◽  
Shunji Goto ◽  
...  
Keyword(s):  
Photon Energy ◽  
Energy Stability ◽  
High Photon Energy ◽  
X Ray

Characterization of damage structure in ion implanted SiC using high photon energy synchrotron ellipsometry

2011 ◽  
Vol 519 (9) ◽  
pp. 2791-2794 ◽  
Author(s):  
P. Petrik ◽  
Z. Zolnai ◽  
O. Polgar ◽  
M. Fried ◽  
Z. Betyak ◽  
...  
Keyword(s):  
Photon Energy ◽  
High Photon Energy ◽  
Damage Structure ◽  
Ion Implanted

DIFFERENTIAL INTERFERENCE CONTRAST FOR X-RAY MICROSCOPY: FABRICATION AND CHARACTERIZATION OF TWIN ZONE PLATE OPTICS

2002 ◽  
Vol 09 (01) ◽  
pp. 243-248 ◽  
Author(s):  
ENZO DI FABRIZIO ◽  
BURKHARD KAULICH ◽  
THOMAS WILHEIN ◽  
JEAN SUSINI
Keyword(s):  
Photon Energy ◽  
Differential Interference Contrast ◽  
X Rays ◽  
Full Field ◽  
X Ray ◽  
Nomarski Differential Interference Contrast ◽  
Scanning Transmission ◽  
Imaging Performance ◽  
Dic Technique

A novel X-ray technique for converting the phase information of weakly absorbing specimen into strong image contrast similar to Nomarski differential interference contrast (DIC) is presented. DIC for X-rays is accomplished by the fabrication of a novel X-ray optic (TZP) consisting of two zone plates (ZPs) on both sides of the same substrate, laterally shifted by about one outermost zone width. The feasibility of DIC for X-rays was proven at the ID 21 X-ray microscopy beamline at the ESRF using a full-field imaging microscope and a scanning transmission X-ray microscope, which were operated at 4 keV photon energy. In both microscopes, we observe a tremendous contrast enhancement of up to a factor of 25. Though first experiments were carried out at 4 keV photon energy, this X-ray DIC technique can be adapted to any photon energy where ZPs with appropriate parameters and imaging performance can be designed and manufactured.

Anomalous Small-Angle X-Ray Scattering Characterization of Model Pressure Vessel Alloy Microstructures

1998 ◽  
Vol 540 ◽  
Author(s):  
Dale E. Alexander ◽  
B. J. Kestel ◽  
P. R. Jemian ◽  
G. R. Odette ◽  
D. Klingensmith ◽  
...  
Keyword(s):  
Photon Energy ◽  
Small Angle ◽  
Pressure Vessel ◽  
Annealed Sample ◽  
Scattered Intensity ◽  
X Ray ◽  
X Ray Scattering ◽  
Guinier Analysis ◽  
Ray Scattering

AbstractAnomalous small-angle x-ray scattering (ASAXS) experiments were performed at energies near the Mn-K and Fe-K absorption edges on an Fe-0.9 Cu wt.%-1.0 Mn wt.% alloy subjected to either annealing at 450°C, 24 hrs or irradiation with 10 MeV electrons to 0.5 mdpa at 300°C. A Guinier analysis of the net scattered intensity revealed scatterers with radii of 16.5.16.8 Å and 16.4.17.3 Å for the irradiated and annealed foils, respectively. The variation in net scattered intensity with photon energy in the annealed sample was consistent with scattering contrast variations expected for Cu-rich, Cu-Mn precipitates. Minimal variation in net intensity (scattering contrast) with energy determined that Cu-Mn precipitates were not detected in the irradiated sample.

scholarly journals Investigation of a laser driven vacuum diode X-ray source of photon energy ∼5 keV

1999 ◽  
Vol 17 (3) ◽  
pp. 499-507 ◽  
Author(s):  
Yu.V. KOROBKIN ◽  
I.V. ROMANOV ◽  
A.A. RUPASOV ◽  
D.A. FEDIN ◽  
A.S. SHIKANOV ◽  
...  
Keyword(s):  
Photon Energy ◽  
Laser Pulse Energy ◽  
Laser Pulses ◽  
Spectral Brightness ◽  
X Ray ◽  
Optimum Parameters ◽  
Target Plasma ◽  
Spatial Size ◽  
Set Up

An investigation of a monochromatic point X-ray source of photon energy ∼5 keV was carried out. The source was set up using a laser produced Al plasma as a cathode and a point-tip Ti anode. Optimum parameters of the diode were determined from experimental measurements of X-ray intensity dependence on laser pulse energy, applied accelerating voltage, and distance between target (cathode) and anode, using Nd:glass laser pulses (FWHM 30 ns) of 2 mJ to 4 J energy. Electron temperature characterization of the target plasma was also performed from the XUV emission spectrum (5–80 Å). Parameters of X radiation in Ti K-shells are (1) spectral brightness of ∼1020 photons/cm2-sec-sr-keV, (2) spatial size ∼300 microns, and (3) X-ray pulse duration less than 20 ns.

Tentative study on high-photon-energy quasi-x-ray laser generator by forming plasma x-ray source

2001 ◽  
Author(s):  
Eiichi Sato ◽  
Yasuomi Hayasi ◽  
Toshio Ichimaru ◽  
Hidezo Mori ◽  
Etsuro Tanaka ◽  
...  
Keyword(s):  
Photon Energy ◽  
High Photon Energy ◽  
X Ray

The characterization of x‐ray photocathodes in the 0.1–10‐keV photon energy region

1981 ◽  
Vol 52 (3) ◽  
pp. 1509-1520 ◽  
Author(s):  
B .L. Henke ◽  
J. P. Knauer ◽  
K. Premaratne
Keyword(s):  
Photon Energy ◽  
Energy Region ◽  
X Ray

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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