scholarly journals Quantum charge pumping in graphene-based devices: When lattice defects do help

2013 ◽  
Vol 103 (12) ◽  
pp. 123508 ◽  
Author(s):  
Lucas H. Ingaramo ◽  
Luis E. F. Foa Torres
Keyword(s):  
Lattice Defects ◽  
Charge Pumping ◽  
Quantum Charge

scholarly journals Quantum charge pumping through Majorana bound states

2019 ◽  
Vol 99 (8) ◽  
Author(s):  
Krashna Mohan Tripathi ◽  
Sumathi Rao ◽  
Sourin Das
Keyword(s):  
Bound States ◽  
Charge Pumping ◽  
Majorana Bound States ◽  
Quantum Charge

scholarly journals Enhancing single-parameter quantum charge pumping in carbon-based devices

2011 ◽  
Vol 99 (9) ◽  
pp. 092102 ◽  
Author(s):  
Luis E. F. Foa Torres ◽  
Hernán L. Calvo ◽  
Claudia G. Rocha ◽  
Gianaurelio Cuniberti
Keyword(s):  
Single Parameter ◽  
Charge Pumping ◽  
Quantum Charge ◽  
Carbon Based

scholarly journals Quantum charge pumping and electric polarization in Anderson insulators

2007 ◽  
Vol 76 (3) ◽  
Author(s):  
Chyh-Hong Chern ◽  
Shigeki Onoda ◽  
Shuichi Murakami ◽  
Naoto Nagaosa
Keyword(s):  
Electric Polarization ◽  
Charge Pumping ◽  
Anderson Insulators ◽  
Quantum Charge

Contrast in Scanning Images of Thin Crystals

1972 ◽  
Vol 30 ◽  
pp. 520-521
Author(s):  
S. Kimoto ◽  
H. Hashimoto ◽  
S. Takashima ◽  
R. M. Stern ◽  
T. Ichinokawa
Keyword(s):  
Crystal Surface ◽  
Solid Angle ◽  
Incident Angle ◽  
Intensity Variation ◽  
Lattice Defects ◽  
Scanning Microscope ◽  
Electron Detector ◽  
Backscattered Electrons ◽  
Electron Image ◽  
Backscattered Electron

The most well known application of the scanning microscope to the crystals is known as Coates pattern. The contrast of this image depends on the variation of the incident angle of the beam to the crystal surface. The defect in the crystal surface causes to make contrast in normal scanning image with constant incident angle. The intensity variation of the backscattered electrons in the scanning microscopy was calculated for the defect in the crystals by Clarke and Howie. Clarke also observed the defect using a scanning microscope.This paper reports the observation of lattice defects appears in thin crystals through backscattered, secondary and transmitted electron image. As a backscattered electron detector, a p-n junction detector of 0.9 π solid angle has been prepared for JSM-50A. The gain of the detector itself is 1.2 x 104 at 50 kV and the gain of additional AC amplifier using band width 100 Hz ∼ 10 kHz is 106.

Crystal structure-size relationship in ultrafine metallic particles

1989 ◽  
Vol 47 ◽  
pp. 266-267
Author(s):  
Jun Liu ◽  
Mehmet Sarikaya ◽  
Ilhan A. Aksay
Keyword(s):  
Ultrafine Particles ◽  
Carbon Film ◽  
Lattice Defects ◽  
Careful Examination ◽  
Seeded Growth ◽  
Gold Particles ◽  
Metallic Particles ◽  
Interfacial Structures ◽  
Typical Particle ◽  
Many Particles

Ultrafine particles usually have unique physical properties. This study illustrates how the lattice defects and interfacial structures between particles are related to the size of ultrafine crystalline gold particles.Colloidal gold particles were produced by reducing gold chloride with sodium citrate at 100°C. In this process, particle size can be controlled by changing the concentration of the reactant. TEM samples are prepared by transferring a small amount of solution onto a thin (5 nm) carbon film which is suspended on a copper grid. In this work, all experiments were performed with Philips 430T at 300 kV.With controlled seeded growth, particles of different sizes are produced, as shown in Figure 1. By a careful examination, it can be resolved that very small particles have lattice defects with complex interfaces. Some typical particle structures include multiple twins, resulting in a five-fold symmetry bicrystals, and highly disordered regions. Many particles are too complex to be described by simple models.

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