Boron-oxygen defect imaging in p-type Czochralski silicon
2016 ◽
Vol 145
◽
pp. 440-446
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2005 ◽
Vol 552
(1-2)
◽
pp. 20-26
◽
2016 ◽
Vol 99
◽
pp. 192-196
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1997 ◽
Vol 57-58
◽
pp. 189-196
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Keyword(s):
2012 ◽
Vol 51
(10S)
◽
pp. 10NA08
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