scholarly journals The effect of surface roughness on the determination of optical constants of CuInSe2 and CuGaSe2 thin films

2013 ◽  
Vol 113 (21) ◽  
pp. 213510 ◽  
Author(s):  
G. Yin ◽  
C. Merschjann ◽  
M. Schmid
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Optical Constants ◽  
Effect Of Surface

Calculation of the optical constants of thin films with consideration of the surface roughness and the width of the spectrum of the probing radiation

1980 ◽  
Vol 32 (4) ◽  
pp. 388-390
Author(s):  
B. V. Panasenko ◽  
A. G. Gusev ◽  
I. S. Gainutdinov ◽  
E. A. Nesmelov ◽  
R. B. Tagirov
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Optical Constants

Determination of the Optical Constants of Thin Films Using Photoacoustic Spectroscopy

1981 ◽  
Vol 20 (9) ◽  
pp. L665-L668 ◽  
Author(s):  
Satoshi Yamasaki ◽  
Hideyo Okushi ◽  
Akihisa Matsuda ◽  
Hidetoshi Oheda ◽  
Nobuhiro Hata ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoacoustic Spectroscopy ◽  
Optical Constants

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

scholarly journals Experimental Determination of Complex Optical Constants of Air‐Stable Inorganic CsPbI 3 Perovskite Thin Films

2020 ◽  
Vol 14 (6) ◽  
pp. 2000070 ◽  
Author(s):  
Wensheng Yan ◽  
Yi Guo ◽  
Deski Beri ◽  
Stephan Dottermusch ◽  
Haining Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Experimental Determination ◽  
Optical Constants

scholarly journals Effect of surface roughness on the anomalous Hall effect in Fe thin films

2020 ◽  
Vol 101 (13) ◽  
Author(s):  
Qiang Zhang ◽  
Dongxing Zheng ◽  
Yan Wen ◽  
Yuelei Zhao ◽  
Wenbo Mi ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Hall Effect ◽  
Anomalous Hall Effect ◽  
Effect Of Surface

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

2001 ◽  
Vol 40 (28) ◽  
pp. 5088 ◽  
Author(s):  
Chubing Peng ◽  
Rongguang Liang ◽  
J. Kevin Erwin ◽  
Warren Bletscher ◽  
Kenichi Nagata ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Multilayer Stacks
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