Determination of stress, strain, and elemental distribution within In(Ga)As quantum dots embedded in GaAs using advanced transmission electron microscopy
1996 ◽
Vol 74
(5)
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pp. 309-315
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2009 ◽
Vol 15
(S2)
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pp. 134-135
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2003 ◽
Vol 205
(1-4)
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pp. 304-308
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1980 ◽
Vol 13
(4)
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pp. 345-350
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2010 ◽
pp. 57-110
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