Determination of metal dispersity of Pd/SiO2 catalysts by transmission electron microscopy and H2−O2 chemisorption

1980 ◽  
Vol 13 (4) ◽  
pp. 345-350 ◽  
Author(s):  
T. Paryjczak ◽  
J. A. Szymura
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron

scholarly journals Determination of the 3-D Magnetic Vector Potential using Lorentz Transmission Electron Microscopy

2009 ◽  
Vol 15 (S2) ◽  
pp. 134-135 ◽  
Author(s):  
C Phatak ◽  
E Humphrey ◽  
M DeGraef ◽  
A Petford-Long
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Vector Potential ◽  
Magnetic Vector Potential ◽  
Magnetic Vector ◽  
Transmission Electron ◽  
Lorentz Transmission Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Determination of Nanocluster Sizes from Dark-Field Scanning Transmission Electron Microscopy Images

2008 ◽  
Vol 112 (6) ◽  
pp. 1759-1763 ◽  
Author(s):  
Norihiko L. Okamoto ◽  
Bryan W. Reed ◽  
Shareghe Mehraeen ◽  
Apoorva Kulkarni ◽  
David Gene Morgan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Microscopy Images

Determination of surface crystallography of faceted nanoparticles using transmission electron microscopy imaging and diffraction modes

2009 ◽  
Vol 42 (3) ◽  
pp. 519-524 ◽  
Author(s):  
Song Li ◽  
Yudong Zhang ◽  
Claude Esling ◽  
Jacques Muller ◽  
Jean-Sébastien Lecomte ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Coordinate System ◽  
Calculation Method ◽  
Microscopy Imaging ◽  
Plane Normal ◽  
Transmission Electron ◽  
Structure Of Nanoparticles ◽  
Normal Vectors

A general calculation method is proposed to characterize the crystalline planes and directions of a faceted nanoparticle using transmission electron microscopy (TEM) imaging and diffraction modes. With the determination of the edge vectors and then the plane normal vectors in the screen coordinate system of TEM, their Miller indices in the crystal coordinate system can be calculated through coordinate transformation. The method is helpful for related studies of the determination of the surface structure of nanoparticles.

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