scholarly journals Bandwidth-variable tunable optical filter unit for illumination and spectral imaging systems using thin-film optical band-pass filters

2013 ◽  
Vol 84 (4) ◽  
pp. 043113 ◽  
Author(s):  
Georg Hennig ◽  
Gary M. Brittenham ◽  
Ronald Sroka ◽  
Gesa Kniebühler ◽  
Michael Vogeser ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Filter ◽  
Spectral Imaging ◽  
Imaging Systems ◽  
Tunable Optical Filter ◽  
Band Pass ◽  
Filter Unit

C-band three-port tunable band-pass thin film optical filter with low polarization-sensitivity

2008 ◽  
Vol 281 (14) ◽  
pp. 3709-3714 ◽  
Author(s):  
Kan Yu ◽  
Wen Liu ◽  
Dexiu Huang ◽  
Jing Chang
Keyword(s):  
Thin Film ◽  
Optical Filter ◽  
Polarization Sensitivity ◽  
Band Pass

Electronically tunable narrow-band-pass optical filter for spectral imaging

1996 ◽  
Author(s):  
Duane E. Paulsen ◽  
Vladimir Pelekhaty ◽  
XiaoLu L. Wang
Keyword(s):  
Narrow Band ◽  
Optical Filter ◽  
Spectral Imaging ◽  
Band Pass ◽  
Electronically Tunable

Performance and Reliability of a MEMS-based tunable optical filter operating in the 1565 nm-1525 nm wavelength range

2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Line Width ◽  
Insertion Loss ◽  
Optical Filter ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Reliability Testing ◽  
Silicon Nitride Membrane ◽  
Tunable Optical Filter ◽  
Extensive Performance

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.

A Switchable Optical Filter between Band-stop and Band-pass Responses

2020 ◽  
Author(s):  
Weijun Jiang ◽  
Lu Xu ◽  
Xiaolong Liu ◽  
Yu Yu ◽  
Yuan Yu ◽  
...  
Keyword(s):  
Optical Filter ◽  
Band Pass

Analysis of background irradiation in thermal IR hyper-spectral imaging systems

2010 ◽  
Author(s):  
Weiming Xu ◽  
Liyin Yuan ◽  
Ying Lin ◽  
Zhiping He ◽  
Rong Shu ◽  
...  
Keyword(s):  
Spectral Imaging ◽  
Imaging Systems ◽  
Hyper Spectral ◽  
Hyper Spectral Imaging
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