Direct measurements of field-induced strain in magnetoelectric composites by X-ray diffraction studies of forbidden reflections

2013 ◽  
Vol 113 (12) ◽  
pp. 124303 ◽  
Author(s):  
M. Abes ◽  
C. T. Koops ◽  
S. B. Hrkac ◽  
E. Quandt ◽  
L. Bouchenoire ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
Magnetoelectric Composites ◽  
Direct Measurements

Direct measurements of field-induced strain at magnetoelectric interfaces by grazing incidence x-ray diffraction

2013 ◽  
Vol 102 (1) ◽  
pp. 011601 ◽  
Author(s):  
M. Abes ◽  
C. T. Koops ◽  
S. B. Hrkac ◽  
H. Greve ◽  
E. Quandt ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Direct Measurements

Electrical and Magnetoelectric Properties of (Y)Li0.5Ni0.7Zn0.05Fe2O4 + (1-Y)Ba0.5Sr0.5TiO3 Magnetoelectric Composites

2014 ◽  
Vol 592-594 ◽  
pp. 826-830 ◽  
Author(s):  
S.U. Durgadsimi ◽  
S.S. Chougule ◽  
S.S. Bellad
Keyword(s):  
Dielectric Behavior ◽  
Dc Resistivity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Magnetoelectric Composites ◽  
Voltage Coefficient ◽  
Magnetoelectric Properties ◽  
Semiconductor Behavior ◽  
Tan Δ ◽  
Increasing Temperature

(y) Li0.5Ni0.7Zn0.05Fe2O4+ (1-y) Ba0.5Sr0.5TiO3magnetoelectric composites with y = 0.1, 0.3 and 0.5 were prepared by a conventional standard double sintering ceramic technique. X-ray diffraction analysis confirmed the phase formation of ferrite, ferroelectric and their composites. logρdcVs 1/T graphs reveal that the dc resistivity decreases with increasing temperature exhibiting semiconductor behavior. The plots of logσacVs logω2are almost linear indicating that the conductivity increases with increase in frequency i.e. conductivity in the composites is due to small poloron hopping. Dielectric constant (έ) and dielectric loss (tan δ) were studied as a function of frequency in the range 100Hz–1MHz which reveal the normal dielectric behavior except the composite with y = 0.1and as a function of temperature at four fixed frequencies (i.e. 100Hz, 1KHz, 10KHz, 100KHz). ME voltage coefficient decreases with increase in ferrite content and was observed to be maximum of about 7.495 mV/cmOe for S1i.e. (0.1) Li0.5Ni0.7Zn0.05Fe2O4+ (0.9) Ba0.5Sr0.5TiO3composite.

Dielectric and Magnetoelectric Properties of Nano-Microscale Lead-Free Composite by 0.4Co-Ferrite and 0.6(K0.5Na0.5)NbO3-Based Ferroelectric Matrix

2011 ◽  
Vol 80-81 ◽  
pp. 271-275
Author(s):  
You Xiang Ye ◽  
Sheng Hua Zhou ◽  
Yun Zhou
Keyword(s):  
Ferroelectric Materials ◽  
Lead Free ◽  
X Ray Diffraction ◽  
X Ray ◽  
Magnetoelectric Composites ◽  
Voltage Coefficient ◽  
Materials Used ◽  
Couple Effect ◽  
Very High ◽  
Potential Use

Lead-free multiferroic magnetoelectric composites were prepared by incorporating the dispersed 0.4CoFe2O4ferromagnetic nanoparticles into 0.6(K0.5Na0.5)NbO3-LiSbO3ferroelectric micromatrix. From the x-ray diffraction analysis, it was observed that almost no chemical reaction occurs between the ferrite and the ferroelectric materials used to form the composite. Dielectric properties as a function of frequency were measured. The magnetoelectric couple effect was given as a function of magnetic field with a maximum magnetoelectric voltage coefficient of 15.01mV·cm-1·Oe-1at 1kHz, which was a very high value in the lead-free magnetoelectric composites system for the potential use on actuators and sensors, etc.

Direct measurements of compressive and tensile strain during shock breakout by use of subnanosecond x‐ray diffraction

1990 ◽  
Vol 68 (9) ◽  
pp. 4531-4534 ◽  
Author(s):  
J. S. Wark ◽  
D. Riley ◽  
N. C. Woolsey ◽  
G. Keihn ◽  
R. R. Whitlock
Keyword(s):  
Tensile Strain ◽  
X Ray Diffraction ◽  
X Ray ◽  
Direct Measurements

Biophysical contributions to membrance structure

1969 ◽  
Vol 2 (1) ◽  
pp. 1-23 ◽  
Author(s):  
J. B. Finean
Keyword(s):  
Additional Data ◽  
Structural Parameters ◽  
Resonance Absorption ◽  
Optical Rotatory Dispersion ◽  
Spectroscopic Techniques ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Past ◽  
Direct Measurements ◽  
Molecular Components

Applications of physical techniques to studies of membrane structure have increased greatly in the past few years and they have begun to provide more precise structural parameters for membranes and also some indication of the physical states of the molecular constituents in the membranes. Direct measurements of membrane features have been made by electron microscopy and by X-ray diffraction methods. Spectroscopic techniques especially infrared absorption, nuclear magnetic resonance absorption and optical rotatory dispersion and circular dichroism measurements have provided additional data relating to the physical states of the molecular components in the membranes.

Influence of Rapid Quenching on Magnetocaloric Effect of Y2(Fe,Mn)17 Intermetallic Compounds

2015 ◽  
Vol 233-234 ◽  
pp. 196-199 ◽  
Author(s):  
Alexey I. Zvonov ◽  
N.Yu. Pankratov ◽  
Dmitriy Karpenkov ◽  
Alexey Karpenkov ◽  
S.A. Nikitin
Keyword(s):  
Crystal Structure ◽  
Magnetocaloric Effect ◽  
Low Cost ◽  
Rapid Quenching ◽  
Glass Forming Ability ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Forming ◽  
Polycrystalline Alloys ◽  
Direct Measurements

The melt-spun Y2(Fe,Mn)17ribbons were synthesized by rapid quenching from the melt. The phase composition, crystal structure and magnetocaloric effect (MCE) in low-cost iron-based pseudo-binary Y2(Fe,Mn)17ribbons were investigated respectively by using x-ray diffraction and direct measurements of MCE. It was found that crystal structure of the as-spun ribbons retains hexagonal Th2Ni17-type because of the weak glass-forming ability. The Y2Fe14Mn3and Y2Fe13Mn4nanostructured ribbons demonstrate higher MCE compare to polycrystalline alloys.

Mapping the Strain State of 3C-SiC/Si (001) Suspended Structures Using μ-XRD

2016 ◽  
Vol 858 ◽  
pp. 274-277 ◽  
Author(s):  
Gerard Colston ◽  
Stephen D. Rhead ◽  
Vishal Ajit Shah ◽  
Oliver J. Newell ◽  
Igor P. Dolbnya ◽  
...  
Keyword(s):  
Convenient Method ◽  
Residual Strain ◽  
Tensile Strain ◽  
Strain State ◽  
Strain Relaxation ◽  
Lattice Parameters ◽  
Raman Shift ◽  
X Ray Diffraction ◽  
X Ray ◽  
Direct Measurements

The residual strain has been mapped across suspended 3C-SiC membranes and wires using synchrotron based micro X-ray diffraction (μ-XRD). Residual tensile strain is observed to relax slightly upon suspension in both sets of structures. Similar maps were acquired by calculating the residual strain from the shift in 3C-SiC Raman peaks. Comparable trends in strain relaxation are observed by both methods, although the sensitivity of μ-XRD is higher using our measurement conditions. While Raman shift provides a fast and convenient method for mapping strain variations, it cannot give direct measurements of the lattice parameters that can be achieved with μ-XRD, making these techniques excellent complimentary methods of mapping residual strain in 3C-SiC.

scholarly journals Ferroelectric and Dielectric Properties of ZnFe2O4-Pb(ZrTi)O3Multiferroic Nanocomposites

2015 ◽  
Vol 2015 ◽  
pp. 1-5 ◽  
Author(s):  
Shrabanee Sen ◽  
Sk. Md. Mursalin ◽  
M. Maharajan
Keyword(s):  
Lead Zirconate Titanate ◽  
Ferroelectric Properties ◽  
Sol Gel ◽  
Hysteresis Loops ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
Nanosized Powders ◽  
X Ray ◽  
Magnetoelectric Composites ◽  
Gel Technique

Magnetoelectric composites of zinc ferrite and soft lead zirconate titanate (PZT) having formula 0.5 ZnFe2O4-0.5 PZT were synthesized by sol-gel technique. X-ray diffraction analysis was carried out to confirm the coexistence of individual phase. TEM micrographs were taken to confirm the formation of nanosized powders and SEM micrographs were taken to study the morphology of the sintered pellets. Dielectric and P-E hysteresis loops were recorded, respectively, to confirm the ferroelectric properties of the composites.

Measuring the interface stress: Silver/nickel interfaces

1999 ◽  
Vol 14 (11) ◽  
pp. 4358-4365 ◽  
Author(s):  
D. Josell ◽  
J. E. Bonevich ◽  
I. Shao ◽  
R. C. Cammarata
Keyword(s):  
Interface Stress ◽  
Bilayer Thickness ◽  
Surface Thermodynamics ◽  
X Ray Diffraction ◽  
Multilayered Thin Film ◽  
X Ray ◽  
Direct Measurements ◽  
Volume Stress ◽  
Deposited Films ◽  
Elastic Strains

Interface stress is a surface thermodynamics quantity associated with the reversible work of elastically straining an internal solid interface. In a multilayered thin film, the combined effect of the interface stress of each interface results in an in-plane biaxial volume stress acting within the layers of the film that is inversely proportional to the bilayer thickness. We calculated the interface stress of an interface between {111} textured Ag and Ni on the basis of direct measurements of the dependence of the in-plane elastic strains on the bilayer thickness. The strains were obtained using transmission x-ray diffraction. Unlike previous studies of this type, we used freestanding films so that there was no need to correct for intrinsic stresses resulting from forces applied by the substrate that can lead to large uncertainties of the calculated interface stress value. Based on the lattice parameters of the bulk, pure elements, an interface stress of −2.02 ± 0.26 N/m was calculated using the x-ray diffraction results from films with bilayer thicknesses greater than 5 nm. This value is somewhat smaller than previous measurements obtained from as-deposited films supported by substrates. For smaller bilayer thicknesses the apparent interface stress becomes smaller in magnitude, possibly due to a loss of layering in the specimens.

scholarly journals Dielectric Properties of 0.95 ( )-0.05 Composites

2011 ◽  
Vol 2011 ◽  
pp. 1-5 ◽  
Author(s):  
Rekha Rani ◽  
Parveen Kumar ◽  
J. K. Juneja ◽  
K. K. Raina ◽  
Chandra Prakash
Keyword(s):  
Dielectric Properties ◽  
Lead Zirconate Titanate ◽  
Nickel Ferrite ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
Reaction Route ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Magnetoelectric Composites ◽  
Solid State Reaction Route

We report studies on dielectric properties of magnetoelectric composites of La-substituted lead zirconate titanate (PLZT) and zinc-doped nickel ferrite (NZF) with compositional formula 0.95 Pb1-3x/2LaxZr0.65Ti0.35O3-0.05 Ni0.8Zn0.2Fe2O4(, 0.01, 0.02, and 0.03). The materials were synthesized by conventional solid state reaction route. The presence of individual phases (PLZT and NZF) was confirmed by using X-ray diffraction technique. Dielectric properties were studied as a function of temperature and frequency. Significant improvement was observed in dielectric properties with addition of La.

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