Thermal analysis of amorphous oxide thin-film transistor degraded by combination of joule heating and hot carrier effect
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2011 ◽
Vol 58
(4)
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pp. 1127-1133
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2014 ◽
Vol 24
(23)
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pp. 3482-3487
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2002 ◽
Vol 41
(Part 2, No. 1A/B)
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pp. L13-L16
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