scholarly journals Thermal analysis of amorphous oxide thin-film transistor degraded by combination of joule heating and hot carrier effect

2013 ◽  
Vol 102 (5) ◽  
pp. 053506 ◽  
Author(s):  
Satoshi Urakawa ◽  
Shigekazu Tomai ◽  
Yoshihiro Ueoka ◽  
Haruka Yamazaki ◽  
Masashi Kasami ◽  
...  
2011 ◽  
Vol 58 (4) ◽  
pp. 1127-1133 ◽  
Author(s):  
Dae Woong Kwon ◽  
Jang Hyun Kim ◽  
Ji Soo Chang ◽  
Sang Wan Kim ◽  
Wandong Kim ◽  
...  

1996 ◽  
Author(s):  
Satoshi Matsumoto ◽  
Hideki Yaginuma ◽  
Toshiaki Yachi

2008 ◽  
Vol 93 (19) ◽  
pp. 192107 ◽  
Author(s):  
Kenji Nomura ◽  
Toshio Kamiya ◽  
Hiromichi Ohta ◽  
Masahiro Hirano ◽  
Hideo Hosono

2003 ◽  
Vol 93 ◽  
pp. 31-36
Author(s):  
H. Nakagawa ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama ◽  
Yukiharu Uraoka ◽  
Takashi Fuyuki ◽  
...  

2014 ◽  
Vol 24 (23) ◽  
pp. 3482-3487 ◽  
Author(s):  
Seongpil Chang ◽  
Yun Seon Do ◽  
Jong-Woo Kim ◽  
Bo Yeon Hwang ◽  
Jinnil Choi ◽  
...  

2002 ◽  
Vol 41 (Part 2, No. 1A/B) ◽  
pp. L13-L16 ◽  
Author(s):  
Yukiharu Uraoka ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama ◽  
Takashi Fuyuki

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