scholarly journals Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method

2012 ◽  
Vol 101 (24) ◽  
pp. 242906 ◽  
Author(s):  
Qian Li ◽  
Yun Liu ◽  
Danyang Wang ◽  
Ray L. Withers ◽  
Zhenrong Li ◽  
...  
Keyword(s):  
Open Loop ◽  
Spectroscopic Measurement ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Ferroelectric Surfaces ◽  
Microscopy Method

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

scholarly journals Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

2021 ◽  
Vol 12 ◽  
pp. 1115-1126
Author(s):  
Gheorghe Stan ◽  
Pradeep Namboodiri
Keyword(s):  
Amplitude Modulation ◽  
Contact Potential Difference ◽  
Open Loop ◽  
Kelvin Probe Force Microscopy ◽  
Potential Difference ◽  
Kelvin Probe ◽  
Contact Potential ◽  
Force Microscopy ◽  
Single Pass ◽  
Afm Probe

The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be analyzed a posteriori, modeled, and interpreted to include various contributions from the probe geometry and imaged features of the sample. In contrast to this, the currently implemented closed-loop (CL) variants of KPFM, either amplitude-modulation (AM) or frequency-modulation (FM), solely report on their final product in terms of the tip–sample contact potential difference. In ambient atmosphere, both CL AM-KPFM and CL FM-KPFM work at their best during the lift part of a two-pass scanning mode to avoid the direct contact with the surface of the sample. In this work, a new OL AM-KPFM mode was implemented in the single-pass scan of the PeakForce Tapping (PFT) mode. The topographical and electrical components were combined in a single pass by applying the electrical modulation only in between the PFT tip–sample contacts, when the AFM probe separates from the sample. In this way, any contact and tunneling discharges are avoided and, yet, the location of the measured electrical tip–sample interaction is directly affixed to the topography rendered by the mechanical PFT modulation at each tap. Furthermore, because the detailed response of the cantilever to the bias stimulation was recorded, it was possible to analyze and separate an average contribution of the cantilever to the determined local contact potential difference between the AFM probe and the imaged sample. The removal of this unwanted contribution greatly improved the accuracy of the AM-KPFM measurements to the level of the FM-KPFM counterpart.

Open-loop band excitation Kelvin probe force microscopy

2012 ◽  
Vol 23 (12) ◽  
pp. 125704 ◽  
Author(s):  
Senli Guo ◽  
Sergei V Kalinin ◽  
Stephen Jesse
Keyword(s):  
Open Loop ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

scholarly journals Open loop Kelvin probe force microscopy with single and multi-frequency excitation

2013 ◽  
Vol 24 (47) ◽  
pp. 475702 ◽  
Author(s):  
L Collins ◽  
J I Kilpatrick ◽  
S A L Weber ◽  
A Tselev ◽  
I V Vlassiouk ◽  
...  
Keyword(s):  
Open Loop ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Frequency Excitation
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