Water assisted gate induced temporal surface charge distribution probed by electrostatic force microscopy

2012 ◽  
Vol 112 (8) ◽  
pp. 084329 ◽  
Author(s):  
Y. Pascal-Levy ◽  
E. Shifman ◽  
I. Sivan ◽  
I. Kalifa ◽  
M. Pal-Chowdhury ◽  
...  
Keyword(s):  
Surface Charge ◽  
Charge Distribution ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy ◽  
Surface Charge Distribution

Microstructure and Local Charge Distribution in Hydrogenated Nanocrystalline Silicon under Illumination Studied by Electrostatic Force Microscopy.

2013 ◽  
Vol 1493 ◽  
pp. 201-206
Author(s):  
Rubana Bahar Priti ◽  
Venkat Bommisetty
Keyword(s):  
Grain Boundaries ◽  
Charge Distribution ◽  
Bias Voltage ◽  
Electrostatic Force ◽  
Nanocrystalline Silicon ◽  
Electrostatic Force Microscopy ◽  
Strained Si ◽  
Force Microscopy ◽  
Local Charge ◽  
Before And After

ABSTRACTHydrogenated nanocrystalline silicon (nc-Si:H) is a promising absorber material for photovoltaic applications. Nanoscale electrical conductivity and overall electronic quality of this material are significantly affected by film microstructure, specifically the density and dimension of grains and grain-boundaries (GB). Local charge distribution at grains and grain/GB interfaces of nc-Si:H was studied by Electrostatic Force Microscopy (EFM) in constant force mode under illumination of white LED. Bias voltage from -3V to +3V was applied on the tip. Scanning Kelvin Force (KFM) images were taken before and after illumination to study the change in surface photovoltage (SP). EFM and KFM analysis were combined with film topography to draw a correlation between surface morphology and nanoscale charge distribution in this material. After illumination, small blister like structures were observed whose size and density increase with time. Raman spectroscopy confirmed these new structures as nanocrystalline silicon. This change was assumed due to relaxation of strained Si-Si bonds as an effect of photo response. Nanocrystalline grain interiors were at lower potential and amorphous grain boundaries were at higher potential for negative bias; it was opposite for positive bias. Change in polarity in bias voltage reversed the polarity of the potential in grains and GBs indicating the dominance of negative type of defects. Further study with current sensing AFM in dark and illumination with variable bias voltages will be able to identify the type and density of defects in grains and grain/GB interfaces.

Characterization of the surface charge distribution on kaolinite particles using high resolution atomic force microscopy

2016 ◽  
Vol 175 ◽  
pp. 100-112 ◽  
Author(s):  
Naveen Kumar ◽  
Cunlu Zhao ◽  
Aram Klaassen ◽  
Dirk van den Ende ◽  
Frieder Mugele ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Surface Charge ◽  
Charge Distribution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Charge Distribution

Relationship between charge distribution and its image by electrostatic force microscopy

2003 ◽  
Vol 93 (9) ◽  
pp. 5369-5376 ◽  
Author(s):  
Jérôme Lambert ◽  
Claudine Guthmann ◽  
Michel Saint-Jean
Keyword(s):  
Charge Distribution ◽  
Electrostatic Force ◽  
Electrostatic Force Microscopy ◽  
Force Microscopy

scholarly journals Mapping Surface Charge Distribution of Single-Cell via Charged Nanoparticle

Cells ◽  
2021 ◽  
Vol 10 (6) ◽  
pp. 1519
Author(s):  
Leixin Ouyang ◽  
Rubia Shaik ◽  
Ruiting Xu ◽  
Ge Zhang ◽  
Jiang Zhe
Keyword(s):  
Cell Surface ◽  
Charge Density ◽  
Surface Charge ◽  
Charge Distribution ◽  
Surface Charge Density ◽  
Single Cells ◽  
Fluorescent Light ◽  
Fluorescent Nanoparticles ◽  
Cell Surface Charge ◽  
Surface Charge Distribution

Many bio-functions of cells can be regulated by their surface charge characteristics. Mapping surface charge density in a single cell’s surface is vital to advance the understanding of cell behaviors. This article demonstrates a method of cell surface charge mapping via electrostatic cell–nanoparticle (NP) interactions. Fluorescent nanoparticles (NPs) were used as the marker to investigate single cells’ surface charge distribution. The nanoparticles with opposite charges were electrostatically bonded to the cell surface; a stack of fluorescence distribution on a cell’s surface at a series of vertical distances was imaged and analyzed. By establishing a relationship between fluorescent light intensity and number of nanoparticles, cells’ surface charge distribution was quantified from the fluorescence distribution. Two types of cells, human umbilical vein endothelial cells (HUVECs) and HeLa cells, were tested. From the measured surface charge density of a group of single cells, the average zeta potentials of the two types of cells were obtained, which are in good agreement with the standard electrophoretic light scattering measurement. This method can be used for rapid surface charge mapping of single particles or cells, and can advance cell-surface-charge characterization applications in many biomedical fields.

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

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