scholarly journals Surface Charge Migration Tracked by Tip-Synchronized Time-Resolved Electrostatic Force Microscopy

2020 ◽  
Vol 63 (5) ◽  
pp. 245-250
Author(s):  
Takuya MATSUMOTO ◽  
Kento ARAKI ◽  
Kentaro KAJIMOTO
2020 ◽  
Vol 124 (25) ◽  
pp. 5063-5070 ◽  
Author(s):  
Kentaro Kajimoto ◽  
Kento Araki ◽  
Yuki Usami ◽  
Hiroshi Ohoyama ◽  
Takuya Matsumoto

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.


2015 ◽  
Vol 6 (15) ◽  
pp. 2852-2858 ◽  
Author(s):  
Phillip A. Cox ◽  
Micah S. Glaz ◽  
Jeffrey S. Harrison ◽  
Samuel R. Peurifoy ◽  
David C. Coffey ◽  
...  

ACS Nano ◽  
2018 ◽  
Vol 13 (1) ◽  
pp. 536-543 ◽  
Author(s):  
Jeffrey S. Harrison ◽  
Dean A. Waldow ◽  
Phillip A. Cox ◽  
Rajiv Giridharagopal ◽  
Marisa Adams ◽  
...  

2015 ◽  
Vol 21 (S3) ◽  
pp. 2349-2350 ◽  
Author(s):  
Durmus U. Karatay ◽  
Jeffrey S. Harrison ◽  
Micah Glaz ◽  
Phillip A. Cox ◽  
David S. Ginger

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