A single-shot transmissive spectrometer for hard x-ray free electron lasers

2012 ◽  
Vol 101 (3) ◽  
pp. 034103 ◽  
Author(s):  
Diling Zhu ◽  
Marco Cammarata ◽  
Jan M. Feldkamp ◽  
David M. Fritz ◽  
Jerome B. Hastings ◽  
...  
2013 ◽  
Vol 21 (23) ◽  
pp. 28729 ◽  
Author(s):  
Hyung Joo Park ◽  
N. Duane Loh ◽  
Raymond G. Sierra ◽  
Christina Y. Hampton ◽  
Dmitri Starodub ◽  
...  

2020 ◽  
Vol 27 (2) ◽  
pp. 254-261 ◽  
Author(s):  
Yanwei Liu ◽  
Matthew Seaberg ◽  
Yiping Feng ◽  
Kenan Li ◽  
Yuantao Ding ◽  
...  

Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor enables measurements over a wide range of energies, as is common on X-ray instruments, with simplified mechanical requirements and is compatible with the high average power pulses expected in upcoming X-ray free-electron laser upgrades. Single-shot measurements were performed at 500 eV, 1000 eV and 1500 eV at the Linac Coherent Light Source. These measurements were applied to study both mirror alignment and the effects of undulator tapering schemes on source properties. The beamline focal plane position was tracked to an uncertainty of 0.12 mm, and the source location for various undulator tapering schemes to an uncertainty of 1 m, demonstrating excellent sensitivity. These findings pave the way to use the fractional Talbot wavefront sensor as a routine, robust and sensitive tool at X-ray free-electron lasers as well as other high-brightness X-ray sources.


ACS Nano ◽  
2018 ◽  
Vol 12 (8) ◽  
pp. 7509-7518 ◽  
Author(s):  
Zhibin Sun ◽  
Jiadong Fan ◽  
Haoyuan Li ◽  
Huajie Liu ◽  
Daewoong Nam ◽  
...  

2013 ◽  
Vol 4 (1) ◽  
Author(s):  
R. Riedel ◽  
A. Al-Shemmary ◽  
M. Gensch ◽  
T. Golz ◽  
M. Harmand ◽  
...  

2019 ◽  
Vol 26 (4) ◽  
pp. 1115-1126 ◽  
Author(s):  
Matthew Seaberg ◽  
Ruxandra Cojocaru ◽  
Sebastien Berujon ◽  
Eric Ziegler ◽  
Andreas Jaggi ◽  
...  

Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique challenges due to high peak powers as well as beam pointing instability, meaning that techniques capable of single-shot measurement and that probe the wavefront at an out-of-focus location are desirable. The techniques chosen for the comparison include single-phase-grating Talbot interferometry (shearing interferometry), dual-grating Talbot interferometry (moiré deflectometry) and speckle tracking. All three methods were implemented during a single beam time at the Linac Coherent Light Source, at the X-ray Pump Probe beamline, in order to make a direct comparison. Each method was used to characterize the wavefront resulting from a stack of beryllium compound refractive lenses followed by a corrective phase plate. In addition, difference wavefront measurements with and without the phase plate agreed with its design to within λ/20, which enabled a direct quantitative comparison between methods. Finally, a path toward automated alignment at XFEL beamlines using a wavefront sensor to close the loop is presented.


2006 ◽  
Vol 97 (8) ◽  
Author(s):  
Makina Yabashi ◽  
Jerome B. Hastings ◽  
Max S. Zolotorev ◽  
Hidekazu Mimura ◽  
Hirokatsu Yumoto ◽  
...  

2019 ◽  
Vol 26 (1) ◽  
pp. 1-10 ◽  
Author(s):  
Bangjie Deng ◽  
Jiawei Yan ◽  
Qingmin Zhang ◽  
Yaodong Sang ◽  
Haixiao Deng

X-ray free-electron lasers (XFELs) have been widely used for applications such as X-ray crystallography and magnetic spin probes because of their unprecedented performance. Recently, time-resolved X-ray magnetic circular dichroism (XMCD) with ultrafast XFEL pulses have made it possible to achieve an instantaneous view of atomic de-excitation. However, owing to the narrow bandwidth and coherence of XFELs, X-ray absorption spectroscopy (XAS) and XMCD are time- and effort-consuming for both machine scientists and users of XFELs. In this work, an efficient scheme using a broadband XFEL pulse and single-shot X-ray spectrometer is proposed, in which the XAS and XMCD measurements can be accomplished with the same machine conditions. An evolutionary multi-objective optimization algorithm is used to maximize the XFEL bandwidth offered by the Shanghai Soft X-ray FEL user facility without additional hardware. A numerical example using MnO is demonstrated, showing that, by using approximately 1000 consecutive XFEL shots with a central photon energy of 650 eV and full bandwidth of 4.4%, precise spectral measurements for XAS and XMCD can be achieved. Additional considerations related to single-shot XAS and XMCD are discussed.


Author(s):  
Uwe Bergmann ◽  
Jan Kern ◽  
Robert W. Schoenlein ◽  
Philippe Wernet ◽  
Vittal K. Yachandra ◽  
...  

2021 ◽  
pp. 100097
Author(s):  
Nanshun Huang ◽  
Haixiao Deng ◽  
Bo Liu ◽  
Dong Wang ◽  
Zhentang Zhao

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