scholarly journals Necessary Experimental Conditions for Single-Shot Diffraction Imaging of DNA-Based Structures with X-ray Free-Electron Lasers

ACS Nano ◽  
2018 ◽  
Vol 12 (8) ◽  
pp. 7509-7518 ◽  
Author(s):  
Zhibin Sun ◽  
Jiadong Fan ◽  
Haoyuan Li ◽  
Huajie Liu ◽  
Daewoong Nam ◽  
...  
Keyword(s):  
Free Electron ◽  
Single Shot ◽  
Free Electron Lasers ◽  
Experimental Conditions ◽  
X Ray ◽  
Diffraction Imaging

scholarly journals Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers

2013 ◽  
Vol 21 (23) ◽  
pp. 28729 ◽  
Author(s):  
Hyung Joo Park ◽  
N. Duane Loh ◽  
Raymond G. Sierra ◽  
Christina Y. Hampton ◽  
Dmitri Starodub ◽  
...  
Keyword(s):  
Free Electron ◽  
Single Shot ◽  
Free Electron Lasers ◽  
Diffractive Imaging ◽  
X Ray

scholarly journals The free-electron laser FLASH

2015 ◽  
Vol 3 ◽  
Author(s):  
Siegfried Schreiber ◽  
Bart Faatz
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Extreme Ultraviolet ◽  
Laser Flash ◽  
Single Shot ◽  
Short Pulses ◽  
X Ray ◽  
Pump And Probe ◽  
User Facility ◽  
Diffraction Imaging

FLASH at DESY, Hamburg, Germany is the first free-electron laser (FEL) operating in the extreme ultraviolet (EUV) and soft x-ray wavelength range. FLASH is a user facility providing femtosecond short pulses with an unprecedented peak and average brilliance, opening new scientific opportunities in many disciplines. The first call for user experiments has been launched in 2005. The FLASH linear accelerator is based on TESLA superconducting technology, providing several thousands of photon pulses per second to user experiments. Probing femtosecond-scale dynamics in atomic and molecular reactions using, for instance, a combination of x-ray and optical pulses in a pump and probe arrangement, as well as single-shot diffraction imaging of biological objects and molecules, are typical experiments performed at the facility. We give an overview of the FLASH facility, and describe the basic principles of the accelerator. Recently, FLASH has been extended by a second undulator beamline (FLASH2) operated in parallel to the first beamline, extending the capacity of the facility by a factor of two.

scholarly journals Data processing software suiteSITENNOfor coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

2014 ◽  
Vol 21 (3) ◽  
pp. 600-612 ◽  
Author(s):  
Yuki Sekiguchi ◽  
Tomotaka Oroguchi ◽  
Yuki Takayama ◽  
Masayoshi Nakasako
Keyword(s):  
Data Processing ◽  
Free Electron ◽  
Free Electron Laser ◽  
Single Shot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Custom Made ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Ccd Detectors

Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the `diffraction before destruction' scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite namedSITENNOhas been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using theSITENNOsuite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles.

A single-shot transmissive spectrometer for hard x-ray free electron lasers

2012 ◽  
Vol 101 (3) ◽  
pp. 034103 ◽  
Author(s):  
Diling Zhu ◽  
Marco Cammarata ◽  
Jan M. Feldkamp ◽  
David M. Fritz ◽  
Jerome B. Hastings ◽  
...  
Keyword(s):  
Free Electron ◽  
Single Shot ◽  
Free Electron Lasers ◽  
X Ray

scholarly journals Multiple defocused coherent diffraction imaging: method for simultaneously reconstructing objects and probe using X-ray free-electron lasers

2016 ◽  
Vol 24 (11) ◽  
pp. 11917 ◽  
Author(s):  
Makoto Hirose ◽  
Kei Shimomura ◽  
Akihiro Suzuki ◽  
Nicolas Burdet ◽  
Yukio Takahashi
Keyword(s):  
Free Electron ◽  
Imaging Method ◽  
Free Electron Lasers ◽  
X Ray ◽  
Coherent Diffraction Imaging ◽  
Diffraction Imaging

scholarly journals X-ray free-electron laser wavefront sensing using the fractional Talbot effect

2020 ◽  
Vol 27 (2) ◽  
pp. 254-261 ◽  
Author(s):  
Yanwei Liu ◽  
Matthew Seaberg ◽  
Yiping Feng ◽  
Kenan Li ◽  
Yuantao Ding ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Average Power ◽  
Wavefront Sensor ◽  
Wavefront Sensing ◽  
Single Shot ◽  
Free Electron Lasers ◽  
X Ray ◽  
Wide Range ◽  
Linac Coherent Light Source

Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor enables measurements over a wide range of energies, as is common on X-ray instruments, with simplified mechanical requirements and is compatible with the high average power pulses expected in upcoming X-ray free-electron laser upgrades. Single-shot measurements were performed at 500 eV, 1000 eV and 1500 eV at the Linac Coherent Light Source. These measurements were applied to study both mirror alignment and the effects of undulator tapering schemes on source properties. The beamline focal plane position was tracked to an uncertainty of 0.12 mm, and the source location for various undulator tapering schemes to an uncertainty of 1 m, demonstrating excellent sensitivity. These findings pave the way to use the fractional Talbot wavefront sensor as a routine, robust and sensitive tool at X-ray free-electron lasers as well as other high-brightness X-ray sources.

scholarly journals Single-shot pulse duration monitor for extreme ultraviolet and X-ray free-electron lasers

2013 ◽  
Vol 4 (1) ◽  
Author(s):  
R. Riedel ◽  
A. Al-Shemmary ◽  
M. Gensch ◽  
T. Golz ◽  
M. Harmand ◽  
...  
Keyword(s):  
Pulse Duration ◽  
Free Electron ◽  
Extreme Ultraviolet ◽  
Single Shot ◽  
Free Electron Lasers ◽  
X Ray

scholarly journals Wavefront sensing at X-ray free-electron lasers

2019 ◽  
Vol 26 (4) ◽  
pp. 1115-1126 ◽  
Author(s):  
Matthew Seaberg ◽  
Ruxandra Cojocaru ◽  
Sebastien Berujon ◽  
Eric Ziegler ◽  
Andreas Jaggi ◽  
...  
Keyword(s):  
Free Electron ◽  
Phase Plate ◽  
Wavefront Sensing ◽  
Single Shot ◽  
Free Electron Lasers ◽  
X Ray ◽  
Single Beam ◽  
Linac Coherent Light Source ◽  
Automated Alignment ◽  
Talbot Interferometry

Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique challenges due to high peak powers as well as beam pointing instability, meaning that techniques capable of single-shot measurement and that probe the wavefront at an out-of-focus location are desirable. The techniques chosen for the comparison include single-phase-grating Talbot interferometry (shearing interferometry), dual-grating Talbot interferometry (moiré deflectometry) and speckle tracking. All three methods were implemented during a single beam time at the Linac Coherent Light Source, at the X-ray Pump Probe beamline, in order to make a direct comparison. Each method was used to characterize the wavefront resulting from a stack of beryllium compound refractive lenses followed by a corrective phase plate. In addition, difference wavefront measurements with and without the phase plate agreed with its design to within λ/20, which enabled a direct quantitative comparison between methods. Finally, a path toward automated alignment at XFEL beamlines using a wavefront sensor to close the loop is presented.

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