Self-powered micro-structured solid state neutron detector with very low leakage current and high efficiency

2012 ◽  
Vol 100 (24) ◽  
pp. 243507 ◽  
Author(s):  
R. Dahal ◽  
K. C. Huang ◽  
J. Clinton ◽  
N. LiCausi ◽  
J.-Q. Lu ◽  
...  
2013 ◽  
Author(s):  
Kuan-Chih Huang ◽  
Rajendra Dahal ◽  
James J.-Q. Lu ◽  
Yaron Danon ◽  
Ishwara B. Bhat

2014 ◽  
Vol 7 (2) ◽  
pp. 451-458 ◽  
Author(s):  
Sung‐Ho Lee ◽  
Kyu‐Tae Kim ◽  
Jung‐Min Kwon ◽  
Bong‐Hwan Kwon

Nanoscale ◽  
2020 ◽  
Vol 12 (29) ◽  
pp. 15677-15686
Author(s):  
Leonard F. Henrichs ◽  
Xiaoke Mu ◽  
Torsten Scherer ◽  
Uta Gerhards ◽  
Stefan Schuppler ◽  
...  

Novel magnetoelectric core–shell ceramics exhibit characteristics of several traditional magnetoelectric composites and combine exceptional magnetoelectric coupling with low leakage current, high density and absence of substrate clamping effects.


2021 ◽  
Vol 285 ◽  
pp. 129120
Author(s):  
Wenxin Liang ◽  
Hongfeng Zhao ◽  
Xiaoji Meng ◽  
Shaohua Fan ◽  
Qingyun Xie

2013 ◽  
Vol 1538 ◽  
pp. 291-302
Author(s):  
Edward Yi Chang ◽  
Hai-Dang Trinh ◽  
Yueh-Chin Lin ◽  
Hiroshi Iwai ◽  
Yen-Ku Lin

ABSTRACTIII-V compounds such as InGaAs, InAs, InSb have great potential for future low power high speed devices (such as MOSFETs, QWFETs, TFETs and NWFETs) application due to their high carrier mobility and drift velocity. The development of good quality high k gate oxide as well as high k/III-V interfaces is prerequisite to realize high performance working devices. Besides, the downscaling of the gate oxide into sub-nanometer while maintaining appropriate low gate leakage current is also needed. The lack of high quality III-V native oxides has obstructed the development of implementing III-V based devices on Si template. In this presentation, we will discuss our efforts to improve high k/III-V interfaces as well as high k oxide quality by using chemical cleaning methods including chemical solutions, precursors and high temperature gas treatments. The electrical properties of high k/InSb, InGaAs, InSb structures and their dependence on the thermal processes are also discussed. Finally, we will present the downscaling of the gate oxide into sub-nanometer scale while maintaining low leakage current and a good high k/III-V interface quality.


2018 ◽  
Vol 65 (2) ◽  
pp. 680-686 ◽  
Author(s):  
Cheng-Jung Lee ◽  
Ke-Jing Lee ◽  
Yu-Chi Chang ◽  
Li-Wen Wang ◽  
Der-Wei Chou ◽  
...  

2021 ◽  
pp. 106413
Author(s):  
Yuexin Yang ◽  
Zhuohui Xu ◽  
Tian Qiu ◽  
Honglong Ning ◽  
Jinyao Zhong ◽  
...  

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