Time‐dependent morphology changes in thin silver films on mica: A scaling analysis of atomic force microscopy results

1996 ◽  
Vol 105 (13) ◽  
pp. 5542-5551 ◽  
Author(s):  
David J. Semin ◽  
Alan Lo ◽  
Shane E. Roark ◽  
Rex T. Skodje ◽  
Kathy L. Rowlen
Keyword(s):  
Atomic Force Microscopy ◽  
Time Dependent ◽  
Scaling Analysis ◽  
Silver Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphology Changes

Scaling Analysis of a- and poly-Si Surface Roughness by Atomic Force Microscopy

1994 ◽  
Vol 367 ◽  
Author(s):  
T. Yoshinobu ◽  
A. Iwamoto ◽  
K. Sudoh ◽  
H. Iwasaki
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Surface Area ◽  
Scaling Behavior ◽  
Linear Size ◽  
Scaling Analysis ◽  
Macroscopic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Roughness Exponent

AbstractThe scaling behavior of the surface roughness of a-and poly-Si deposited on Si was investigated by atomic force microscopy (AFM). The interface width W(L), defined as the rms roughness as a function of the linear size of the surface area, was calculated from various sizes of AFM images. W(L) increased as a power of L with the roughness exponent ∝ on shorter length scales, and saturated at a constant value of on a macroscopic scale. The value of roughness exponent a was 0.48 and 0.90 for a-and poly-Si, respectively, and σ was 1.5 and 13.6nm for 350nm-thick a-Si and 500nm-thick poly-Si, respectively. The AFM images were compared with the surfaces generated by simulation.

Time-Dependent Phase Segregation of Dendrimer/n-Alkylthiol Mixed-Monolayers on Au(111):  An Atomic Force Microscopy Study

Langmuir ◽  
1999 ◽  
Vol 15 (22) ◽  
pp. 7632-7638 ◽  
Author(s):  
William M. Lackowski ◽  
Joseph K. Campbell ◽  
Grant Edwards ◽  
Victor Chechik ◽  
Richard M. Crooks
Keyword(s):  
Atomic Force Microscopy ◽  
Phase Segregation ◽  
Microscopy Study ◽  
Time Dependent ◽  
Atomic Force Microscopy Study ◽  
Mixed Monolayers ◽  
Force Microscopy ◽  
Atomic Force

Scaling Analysis ofSiO2/Si Interface Roughness by Atomic Force Microscopy

1994 ◽  
Vol 33 (Part 1, No. 1B) ◽  
pp. 383-387 ◽  
Author(s):  
Tatsuo Yoshinobu ◽  
Atsushi Iwamoto ◽  
Hiroshi Iwasaki
Keyword(s):  
Atomic Force Microscopy ◽  
Interface Roughness ◽  
Scaling Analysis ◽  
Force Microscopy ◽  
Atomic Force

Scaling analysis of Fe-implanted Ge surfaces using atomic force microscopy

2002 ◽  
Vol 48 (2-3) ◽  
pp. 241-247
Author(s):  
R. Venugopal ◽  
B. Sundaravel ◽  
I.H. Wilson ◽  
J.B. Xu
Keyword(s):  
Atomic Force Microscopy ◽  
Scaling Analysis ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Quantitative atomic force microscopy measurements of Acinetobacter morphology

2020 ◽  
Author(s):  
C. Phoebe Lostroh ◽  
Caroline M. Boyd ◽  
Nicholas Lammers ◽  
Kaleb S. Roush ◽  
Sara L. Worsham ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Growth Curve ◽  
Cell Shape ◽  
Nanometer Scale ◽  
Growth Media ◽  
Wild Type ◽  
Acinetobacter Baylyi ◽  
Force Microscopy ◽  
Atomic Force ◽  
Morphology Changes

Abstract Acinetobacter baylyi are variously reported as spherical or rod-shaped. Here we use atomic force microscopy (AFM) to make quantitative nanometer-scale measurements of cellular length and width for thousands of individual cells. We quantify the heterogeneity of populations grown in varying environmental conditions that dramatically affect cell shape. In particular, we look at morphology changes across a growth curve, and we examine cells from populations grown in various growth media. We also examine the morphology of a minC mutant, which suggests an interpretation for the morphological types observed in wild type cells.

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