Determination of the molecular constants of interacting bright and dark states: Analysis of the high‐resolution infrared spectrum of the S–O stretching fundamental of thionylimide, HNSO

1996 ◽  
Vol 104 (22) ◽  
pp. 8852-8856 ◽  
Author(s):  
Duck‐Lae Joo ◽  
Dennis J. Clouthier
Keyword(s):  
High Resolution ◽  
Infrared Spectrum ◽  
Molecular Constants

Infrared spectrum and molecular constants of CO2 in the 1.4–1.7 μm atmospheric window by very high resolution Fourier transform spectroscopy

1980 ◽  
Vol 58 (11) ◽  
pp. 1560-1569 ◽  
Author(s):  
J. P. Maillard ◽  
M. Cuisenier ◽  
Ph. Arcas ◽  
E. Arié ◽  
C. Amiot
Keyword(s):  
Fourier Transform ◽  
High Resolution ◽  
Infrared Spectrum ◽  
Accurate Determination ◽  
Spectroscopic Constants ◽  
Fourier Transform Spectrometer ◽  
Molecular Constants ◽  
Atmospheric Window ◽  
Very High

The spectrum of CO2 has been recorded in the 1.4–1.7 μm atmospheric window using the very high resolution Fourier transform spectrometer of the Meudon Observatory. This laboratory study has allowed the accurate determination of the spectroscopic constants previously evaluated from the Venus spectrum.

High-Resolution Infrared Spectrum of Diazirine, H2CN2. Rovibrational Analysis of the Methylene Deformation Band

1988 ◽  
Vol 43 (4) ◽  
pp. 331-337 ◽  
Author(s):  
A. Gambi ◽  
A. Baldacci ◽  
S. Giorgianni
Keyword(s):  
Fourier Transform ◽  
High Resolution ◽  
Infrared Spectrum ◽  
Least Squares ◽  
Deformation Band ◽  
Fourier Transform Spectrometer ◽  
Centrifugal Distortion ◽  
Molecular Constants ◽  
Centrifugal Distortion Constants

Abstract The infrared spectrum of diazirine has been recorded at Doppler resolution with a high informa­tion Fourier transform spectrometer. The ν3 fundamental has been reinvestigated and the overall assignment of the rovibrational transitions has been carried out. From the least-squares analysis a more accurate set of molecular constants including the sextic centrifugal distortion constants has been determined for the level υ3 = 1 and will be reported here. The higher resolution achieved here allowed the assignment of weaker lines and many Q branch transitions. Moreover many blended lines have now been resolved and could be properly assigned.

The infrared spectrum and molecular constants of CO2 in the 2 μm region

1983 ◽  
Vol 61 (6) ◽  
pp. 857-866 ◽  
Author(s):  
Ph. Arcas ◽  
E. Arie ◽  
M. Cuisenier ◽  
J. P. Maillard
Keyword(s):  
Fourier Transform ◽  
High Resolution ◽  
Infrared Spectrum ◽  
Good Accuracy ◽  
Vibrational Energy ◽  
Fourier Transform Spectroscopy ◽  
Molecular Constants ◽  
Effective Constants

The spectrum of CO2 has been recorded in the 2 μm region using high resolution Fourier transform spectroscopy. The effective constants have been determined with good accuracy for the (2001, 0401) and (211l, 0511) triads and the 0112–0000 transition. In addition, the vibrational energy of the (3001, 0601)1V level, previously given, has been corrected. The Coriolis resonance, strongly perturbing the (211e1, 051e1)m and (4000, 0800)n levels, has been studied.

High-resolution microscopy of twin boundaries in gold

1987 ◽  
Vol 45 ◽  
pp. 260-261
Author(s):  
William Krakow ◽  
David A. Smith
Keyword(s):  
High Resolution ◽  
Specimen Preparation ◽  
Gold Films ◽  
Boundary Area ◽  
Transmission Electron ◽  
Recent Developments ◽  
Tilt Boundaries ◽  
High Resolution Microscopy ◽  
Twist Boundaries

Recent developments in specimen preparation, imaging and image analysis together permit the experimental determination of the atomic structure of certain, simple grain boundaries in metals such as gold. Single crystal, ∼125Å thick, (110) oriented gold films are vapor deposited onto ∼3000Å of epitaxial silver on (110) oriented cut and polished rock salt substrates. Bicrystal gold films are then made by first removing the silver coated substrate and placing in contact two suitably misoriented pieces of the gold film on a gold grid. Controlled heating in a hot stage first produces twist boundaries which then migrate, so reducing the grain boundary area, to give mixed boundaries and finally tilt boundaries perpendicular to the foil. These specimens are well suited to investigation by high resolution transmission electron microscopy.

High-Resolution Image Simulation of a Tilted Crystal

1990 ◽  
Vol 48 (1) ◽  
pp. 68-69
Author(s):  
C. J. D. Hetherington
Keyword(s):  
High Resolution ◽  
Crystal Thickness ◽  
Thin Specimen ◽  
Atomic Structures ◽  
Kikuchi Lines ◽  
High Resolution Images ◽  
Final Estimate ◽  
Simulated Images ◽  
Habit Planes

Most high resolution images are not directly interpretable but must be compared with simulations based on model atomic structures and appropriate imaging conditions. Typically, the only parameters that are adjusted, in addition to the structure models, are crystal thickness and microscope defocus. Small tilts of the crystal away from the exact zone axis have only rarely been considered. It is shown here that, in the analysis of an image of a silicon twin intersection, the crystal tilt could be accurately estimated and satisfactorily included in the simulations.The micrograph shown in figure 1 was taken as part of an HREM study of indentation-induced hexagonal silicon. In this instance, the intersection of two twins on different habit planes has driven the silicon into hexagonal stacking. However, in order to confirm this observation, and in order to investigate other defects in the region, it has been necessary to simulate the image taking into account the very apparent crystal tilt. The inability to orientate the specimen at the exact [110] zone was influenced by i) the buckling of the specimen caused by strains at twin intersections, ii) the absence of Kikuchi lines or a clearly visible Laue circle in the diffraction pattern of the thin specimen and iii) the avoidance of radiation damage (which had marked effects on images taken a few minutes later following attempts to realign the crystal.) The direction of the crystal tilt was estimated by observing which of the {111} planes remained close to edge-on to the beam and hence strongly imaged. Further refinement of the direction and magnitude of the tilt was done by comparing simulated images to experimental images in a through-focal series. The presence of three different orientations of the silicon lattice aided the unambiguous determination of the tilt. The final estimate of a 0.8° tilt in the 200Å thick specimen gives atomic columns a projected width of about 3Å.

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