scholarly journals Low-temperature, site selective graphitization of SiC via ion implantation and pulsed laser annealing

2012 ◽  
Vol 100 (19) ◽  
pp. 193105 ◽  
Author(s):  
Maxime G. Lemaitre ◽  
Sefaattin Tongay ◽  
Xiaotie Wang ◽  
Dinesh K. Venkatachalam ◽  
Joel Fridmann ◽  
...  
1980 ◽  
Vol 1 ◽  
Author(s):  
S.W. Chiang ◽  
Y.S. Liu ◽  
R.F. Reihl

ABSTRACTHigh-dose ion implantation (1017 ions-cm−2) of C+, N+, and O+ at 50 KeV into silicon followed by pulsed laser annealing at 1.06 μm was studied. Formation of SiC, Si3N4, and SiO2 has been observed and investigated using Transmission Electron Microscopy (TEM) and Differential Fourier-Transform Infrared (FT-IR) Spectroscopy. Furthermore, in N+-implanted and laser-annealed silicon samples, we have observed a cell-like structure which has been identified to be spheroidal polycrystalline silicon formed by the rapid laser irradiation.


2012 ◽  
Vol 5 (9) ◽  
pp. 093007 ◽  
Author(s):  
Shengqiang Zhou ◽  
Yutian Wang ◽  
Zenan Jiang ◽  
Eugen Weschke ◽  
Manfred Helm

Vacuum ◽  
2020 ◽  
Vol 178 ◽  
pp. 109434 ◽  
Author(s):  
Fadei F. Komarov ◽  
Nikita S. Nechaev ◽  
Gennadii D. Ivlev ◽  
Liudmila A. Vlasukova ◽  
Irina N. Parkhomenko ◽  
...  

2013 ◽  
Vol 699 ◽  
pp. 383-386
Author(s):  
Tetsuya Shimogaki ◽  
Taihei Ofuji ◽  
Norihiro Tetsuyama ◽  
Kota Okazaki ◽  
Mitsuhiro Higashihata ◽  
...  

We report on the effect of high repetition pulsed laser annealing with a KrF excimer laser on the optical properties of phosphorus ion-implanted ZnO nanorods. The recovery levels of phosphorus ion-implanted ZnO nanorods have been measured by photoluminescence spectra and cathode luminescence (CL) images. After ion implantation on the surface of ZnO nanorods, CL was disappeared over 400 nm below the surface due to the damage caused by ion implantation. When the annealing was performed at a low repetition, CL was recovered only shallow area below the surface. The depth of the annealed area was increased with the repetition rate of the annealing laser. By optimizing the annealing conditions such as the repetition rate, the irradiation fluence and so on, we have succeeded to anneal the whole damaged area over 400 nm in depth and to observe CL. Thus, the effectiveness of high repetition pulsed laser annealing on phosphorus ion-implanted ZnO nanorods was demonstrated.


1982 ◽  
Vol 21 (Part 2, No. 5) ◽  
pp. L245-L247 ◽  
Author(s):  
Kazuo Itoh ◽  
Yoshisato Sasaki ◽  
Tomokuni Mitsuishi ◽  
Masanobu Miyao ◽  
Masao Tamura

1988 ◽  
Vol 129 (3) ◽  
pp. 180-184 ◽  
Author(s):  
T.A. Kuzemchenko ◽  
A.A. Manenkov ◽  
G.N. Mikhailova ◽  
S.Yu. Sokolov

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