Close-coupling studies of the orientation dependence of rotationally inelastic collisions

1977 ◽  
Vol 67 (6) ◽  
pp. 2703 ◽  
Author(s):  
Millard H. Alexander
Keyword(s):  
Orientation Dependence ◽  
Inelastic Collisions ◽  
Close Coupling

Rigid-Bender Close-Coupling Treatment of the Inelastic Collisions of H2O with para-H2

2019 ◽  
Vol 123 (27) ◽  
pp. 5704-5712 ◽  
Author(s):  
Thierry Stoecklin ◽  
Otoniel Denis-Alpizar ◽  
Alexandre Clergerie ◽  
Philippe Halvick ◽  
Alexandre Faure ◽  
...  
Keyword(s):  
Inelastic Collisions ◽  
Close Coupling ◽  
Coupling Treatment

scholarly journals Close coupling results for inelastic collisions of NH3 and Ar. A stringent test of a spectroscopic potential

1994 ◽  
Vol 226 (1-2) ◽  
pp. 22-26 ◽  
Author(s):  
G.C.M. van der Sanden ◽  
P.E.S. Wormer ◽  
A. van der Avoird ◽  
C.A. Schmuttenmaer ◽  
R.J. Saykally
Keyword(s):  
Inelastic Collisions ◽  
Close Coupling ◽  
Stringent Test

scholarly journals Inelastic collisions in molecular oxygen at low temperature (4 ⩽T⩽ 34 K). Close-coupling calculations versus experiment

2011 ◽  
Vol 134 (17) ◽  
pp. 174307 ◽  
Author(s):  
J. Pérez-Ríos ◽  
G. Tejeda ◽  
J. M. Fernández ◽  
M. I. Hernández ◽  
S. Montero
Keyword(s):  
Low Temperature ◽  
Molecular Oxygen ◽  
Inelastic Collisions ◽  
Close Coupling

An x-ray microprobe based upon a close-coupled focal-spot / glass capillary arrangement

1992 ◽  
Vol 50 (2) ◽  
pp. 1758-1759
Author(s):  
D. A. Carpenter ◽  
M. A. Taylor
Keyword(s):  
Imaging Techniques ◽  
Fluorescence Analysis ◽  
High Sensitivity ◽  
Specimen Preparation ◽  
X Rays ◽  
Glass Capillary ◽  
Close Coupling ◽  
X Ray ◽  
Point To Point ◽  
Beam Damage

The development of intense sources of x rays has led to renewed interest in the use of microbeams of x rays in x-ray fluorescence analysis. Sparks pointed out that the use of x rays as a probe offered the advantages of high sensitivity, low detection limits, low beam damage, and large penetration depths with minimal specimen preparation or perturbation. In addition, the option of air operation provided special advantages for examination of hydrated systems or for nondestructive microanalysis of large specimens.The disadvantages of synchrotron sources prompted the development of laboratory-based instrumentation with various schemes to maximize the beam flux while maintaining small point-to-point resolution. Nichols and Ryon developed a microprobe using a rotating anode source and a modified microdiffractometer. Cross and Wherry showed that by close-coupling the x-ray source, specimen, and detector, good intensities could be obtained for beam sizes between 30 and 100μm. More importantly, both groups combined specimen scanning with modern imaging techniques for rapid element mapping.

Voltage and Orientation Dependence of Characteristic X-Ray Production in Thin Crystals

1985 ◽  
Vol 43 ◽  
pp. 414-415
Author(s):  
G. Thomas ◽  
K. M. Krishnan ◽  
Y. Yokota ◽  
H. Hashimoto
Keyword(s):  
Standing Wave ◽  
Incident Beam ◽  
Orientation Dependence ◽  
Incident Plane Wave ◽  
Crystalline Materials ◽  
X Ray ◽  
Incident Plane ◽  
Crystal Unit Cell ◽  
Beam Orientation ◽  
Acceleration Voltage

For crystalline materials, an incident plane wave of electrons under conditions of strong dynamical scattering sets up a standing wave within the crystal. The intensity modulations of this standing wave within the crystal unit cell are a function of the incident beam orientation and the acceleration voltage. As the scattering events (such as inner shell excitations) that lead to characteristic x-ray production are highly localized, the x-ray intensities in turn, are strongly determined by the orientation and the acceleration voltage. For a given acceleration voltage or wavelength of the incident wave, it has been shown that this orientation dependence of the characteristic x-ray emission, termed the “Borrmann effect”, can also be used as a probe for determining specific site occupations of elemental additions in single crystals.

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