Orientation-dependent critical currents in Y1Ba2Cu3O7−x epitaxial thin films: Evidence for intrinsic flux pinning?

1991 ◽  
Author(s):  
D. K. Christen ◽  
C. E. Klabunde ◽  
R. Feenstra ◽  
D. H. Lowndes ◽  
D. P. Norton ◽  
...  
Keyword(s):  
Thin Films ◽  
Flux Pinning ◽  
Critical Currents ◽  
Epitaxial Thin Films ◽  
Intrinsic Flux

Large, orientation-dependent enhancements of critical currents in Y1Ba2Cu3O7−x epitaxial thin films: Evidence for intrinsic flux pinning?

1990 ◽  
Vol 165-166 ◽  
pp. 1415-1416 ◽  
Author(s):  
D.K. Christen ◽  
C.E. Klabunde ◽  
R. Feenstra ◽  
D.H. Lowndes ◽  
D. Norton ◽  
...  
Keyword(s):  
Thin Films ◽  
Flux Pinning ◽  
Critical Currents ◽  
Epitaxial Thin Films ◽  
Intrinsic Flux

Critical current density and flux pinning in Gd1−xYxBa2Cu3O7−y epitaxial thin films

1995 ◽  
Vol 250 (1-2) ◽  
pp. 55-58 ◽  
Author(s):  
R.L. Wang ◽  
H.C. Li ◽  
B. Yin ◽  
J.W. Li ◽  
X.S. Ron ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Flux Pinning ◽  
Epitaxial Thin Films

Flux creep and high-field critical currents in epitaxial thin films ofYBa2Cu3O7

1989 ◽  
Vol 62 (17) ◽  
pp. 2044-2047 ◽  
Author(s):  
J. D. Hettinger ◽  
A. G. Swanson ◽  
W. J. Skocpol ◽  
J. S. Brooks ◽  
J. M. Graybeal ◽  
...  
Keyword(s):  
Thin Films ◽  
High Field ◽  
Critical Currents ◽  
Flux Creep ◽  
Epitaxial Thin Films

Enhancement of flux pinning by H+and Xe+irradiation in epitaxial thin films of Ba2YCu3O7−δ

1992 ◽  
Vol 60 (23) ◽  
pp. 2932-2934 ◽  
Author(s):  
M. P. Siegal ◽  
R. B. van Dover ◽  
Julia M. Phillips ◽  
E. M. Gyorgy ◽  
A. E. White ◽  
...  
Keyword(s):  
Thin Films ◽  
Flux Pinning ◽  
Epitaxial Thin Films

Transport critical currents and flux pinning mechanisms in single-crystalline thin films of YBa2Cu3O7−δ

1991 ◽  
Vol 181 (4-6) ◽  
pp. 223-232 ◽  
Author(s):  
Terukazu Nishizaki ◽  
Takafumi Aomine ◽  
Itsuhiro Fujii ◽  
Kazunuki Yamamoto ◽  
Shizuka Yoshii ◽  
...  
Keyword(s):  
Thin Films ◽  
Flux Pinning ◽  
Critical Currents ◽  
Single Crystalline

Direct observation of the defect structure and structural interfaces in laser-deposited Y-Ba-Cu-O thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 74-75
Author(s):  
R. Ramesh ◽  
T.S. Ravi ◽  
D.M. Hwang ◽  
C.C. Chang ◽  
X.X. Xi ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Analytical Electron Microscopy ◽  
High Resolution Electron Microscopy ◽  
Critical Currents ◽  
Structural Defects ◽  
Oxide Superconductors ◽  
Epitaxial Thin Films ◽  
Superconducting Transition ◽  
Point To Point

One of the earliest applications of the newly discovered high temperature oxide superconductors is in the area of microelectronics, involving the fabrication of epitaxial thin films and heterostructures on suitable substrates. After examining several thin films deposition techniques, the pulsed excimer laser deposition technique has been found to yield films with excellent superconducting properties including a Tc of 90-91K, a superconducting transition width of less than 0.5°, transport critical currents of 5×106A/cm2 or higher and good microwave properties. The higher critical currents in the thin films, compared to bulk materials, have been attributed to the presence of a wide variety of structural defects that act as flux pinning centers. Hence, we have undertaken a systematic study of the atomic nature of the structural defects. In addition to high resolution electron microscopy(HREM), microdiffraction and analytical electron microscopy are being used to study the microstructure. Specifically, HREM is being carried out using the 1.6A point-to-point resolution and ±45° goniometric tilt capability of the Berkeley Atomic Resolution Microscope(ARM).

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