scholarly journals Weak-stripe magnetic domain evolution with an in-plane field in epitaxial FePd thin films: Model versus experimental results

2000 ◽  
Vol 87 (9) ◽  
pp. 5472-5474 ◽  
Author(s):  
A. Marty ◽  
Y. Samson ◽  
B. Gilles ◽  
M. Belakhovsky ◽  
E. Dudzik ◽  
...  
2017 ◽  
Vol 111 (21) ◽  
pp. 212401 ◽  
Author(s):  
X. H. Liu ◽  
W. Liu ◽  
Z. M. Dai ◽  
S. K. Li ◽  
T. T. Wang ◽  
...  

2019 ◽  
Vol 1 (6) ◽  
pp. 817-822 ◽  
Author(s):  
Dohyung Kim ◽  
Dongyi Zhou ◽  
Songbai Hu ◽  
Dieu Hien Thi Nguyen ◽  
Nagarajan Valanoor ◽  
...  

Author(s):  
B. G. Demczyk

CoCr thin films have been of interest for a number of years due to their strong perpendicular anisotropy, favoring magnetization normal to the film plane. The microstructure and magnetic properties of CoCr films prepared by both rf and magnetron sputtering have been examined in detail. By comparison, however, relatively few systematic studies of the magnetic domain structure and its relation to the observed film microstructure have been reported. In addition, questions still remain as to the operative magnetization reversal mechanism in different film thickness regimes. In this work, the magnetic domain structure in magnetron sputtered Co-22 at.%Cr thin films of known microstructure were examined by Lorentz transmission electron microscopy. Additionally, domain nucleation studies were undertaken via in-situ heating experiments.It was found that the 50 nm thick films, which are comprised of columnar grains, display a “dot” type domain configuration (Figure 1d), characteristic of a perpendicular magnetization. The domain size was found to be on the order of a few structural columns in diameter.


1996 ◽  
Vol 457 ◽  
Author(s):  
R. Banerjee ◽  
X. D. Zhang ◽  
S. A. Dregia ◽  
H. L. Fraser

ABSTRACTNanocomposite Ti/Al multilayered thin films have been deposited by magnetron sputtering. These multilayers exhibit interesting structural transitions on reducing the layer thickness of both Ti and Al. Ti transforms from its bulk stable hep structure to fee and Al transforms from fee to hep. The effect of ratio of Ti layer thickness to Al layer thickness on the structural transitions has been investigated for a constant bilayer periodicity of 10 nm by considering three different multilayers: 7.5 nm Ti / 2.5 nm Al, 5 nm Ti / 5 nm Al and 2.5 nm Ti / 7.5 nm Al. The experimental results have been qualitatively explained on the basis of a thermodynamic model. Preliminary experimental results of interfacial reactions in Ti/Al bilayers resulting in the formation of Ti-aluminides are also presented in the paper.


1985 ◽  
Vol 48 ◽  
Author(s):  
P. Alexopoulos ◽  
R. H. Geiss ◽  
M. Schlenker

ABSTRACTThin films of Co-10 at% Pt, ranging from 15 to 90 nm in thickness, have been DC-sputtered at various temperatures on to carbon-coated mica, carbon substrates on copper grids, or (001) silicon single crystals under 3 μm pressure of Ar, using targets of the alloy in the hexagonal phase, at growth rates of 9 nm/min. The samples were investigated by TEM, using bright-and dark-field imaging, lattice imaging, selected area diffraction and both Fresnel and focussed Lorentz modes. The primary structure of the films was found to be hexagonal, with a = 0.255 nm and c = 0.414 nm. For the samples sputtered at room temperature, the grain sizes were on the order of 0.μm on carbon-coated mica and carbon-substrate grids, and approximately an order of magnitude smaller on silicon substrates. Heavy streaking along the [001] of the hexagonal matrix was observed on diffraction patterns for grains having the [001] parallel to the surface; this streaking was found to be associated with the presence of a high density of faults parallel to the (001). In films sputtered on to carbon-coated mica at 225 °C, where a substantial reduction of the coercivity is observed, the overwhelming majority of the grains had the (001) basal plane parallel to the surface. Lorentz microscopy showed the magnetic domain structure in films grown on silicon to be markedly different from those grown on the carbon substrates, and further changes occurred for the films grown at elevated temperatures.


2014 ◽  
Vol 2 (29) ◽  
pp. 5836-5841 ◽  
Author(s):  
Qi Yu ◽  
Jing-Feng Li ◽  
Fang-Yuan Zhu ◽  
Jiangyu Li

The ferroelectric domains of tetragonal Pb(ZrxTi1−x)O3 epitaxial thin films have been studied comprehensively to reveal their piezoelectric responses under substrate constraint.


2014 ◽  
Vol 116 (8) ◽  
pp. 083901 ◽  
Author(s):  
D. Zhang ◽  
N. M. Ray ◽  
W. T. Petuskey ◽  
D. J. Smith ◽  
M. R. McCartney

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