Precise noise characterization of perpendicular recording media

2000 ◽  
Vol 87 (9) ◽  
pp. 4987-4989 ◽  
Author(s):  
Akihiko Takeo ◽  
Yuka Takahashi ◽  
Yoichiro Tanaka ◽  
Kenji Miura ◽  
Hiroaki Muraoka ◽  
...  
Keyword(s):  
Recording Media ◽  
Perpendicular Recording ◽  
Noise Characterization

Noise Characterization of Perpendicular Recording Media by Cluster Size Measurements

2014 ◽  
Vol 50 (5) ◽  
pp. 1-6 ◽  
Author(s):  
Binni Varghese ◽  
S. N. Piramanayagam ◽  
Wee Kiat Lee ◽  
Hang Khume Tan
Keyword(s):  
Cluster Size ◽  
Recording Media ◽  
Perpendicular Recording ◽  
Noise Characterization

Magnetic Characterization of Perpendicular Recording Media

2016 ◽  
pp. 385-456 ◽  
Author(s):  
Gaspare Varvaro ◽  
Alberto Testa ◽  
Elisabetta Agostinelli ◽  
Davide Peddis ◽  
Sara Laureti
Keyword(s):  
Recording Media ◽  
Perpendicular Recording ◽  
Magnetic Characterization

Soft X-ray characterization of perpendicular recording media

2002 ◽  
Vol 38 (4) ◽  
pp. 1693-1697 ◽  
Author(s):  
E.E. Fullerton ◽  
O. Hellwig ◽  
Y. Ikeda ◽  
B. Lengsfield ◽  
K. Takano ◽  
...  
Keyword(s):  
Recording Media ◽  
Perpendicular Recording ◽  
X Ray

scholarly journals Characterization of Perpendicular Recording Media of CoPtCrO Granular Thin Films.

2001 ◽  
Vol 25 (3−2) ◽  
pp. 226-229 ◽  
Author(s):  
R. Sbiaa ◽  
E. Ahmad ◽  
T. Suzuki ◽  
A. Takeo ◽  
Y. Tanaka
Keyword(s):  
Thin Films ◽  
Recording Media ◽  
Perpendicular Recording

scholarly journals Magnetic characterization of perpendicular recording media

2002 ◽  
Vol 38 (4) ◽  
pp. 1682-1686 ◽  
Author(s):  
Jing Wu ◽  
L. Holloway ◽  
H. Laidler ◽  
K. O'Grady ◽  
S. Khizroev ◽  
...  
Keyword(s):  
Recording Media ◽  
Perpendicular Recording ◽  
Magnetic Characterization

Microstructural characterization of CoPtCr/Cr thin film disks by cross-section TEM and elongated probe micro-diffraction

1991 ◽  
Vol 49 ◽  
pp. 762-763
Author(s):  
M.A. Parker ◽  
K.E. Johnson ◽  
C. Hwang ◽  
A. Bermea
Keyword(s):  
Magnetic Recording ◽  
Electron Probe ◽  
Microstructural Characterization ◽  
Crystallographic Structure ◽  
Recording Media ◽  
Layer By Layer ◽  
Cross Sectional ◽  
New Techniques ◽  
Polished Side

We have reported the dependence of the magnetic and recording properties of CoPtCr recording media on the thickness of the Cr underlayer. It was inferred from XRD data that grain-to-grain epitaxy of the Cr with the CoPtCr was responsible for the interaction observed between these layers. However, no cross-sectional TEM (XTEM) work was performed to confirm this inference. In this paper, we report the application of new techniques for preparing XTEM specimens from actual magnetic recording disks, and for layer-by-layer micro-diffraction with an electron probe elongated parallel to the surface of the deposited structure which elucidate the effect of the crystallographic structure of the Cr on that of the CoPtCr.XTEM specimens were prepared from magnetic recording disks by modifying a technique used to prepare semiconductor specimens. After 3mm disks were prepared per the standard XTEM procedure, these disks were then lapped using a tripod polishing device. A grid with a single 1mmx2mm hole was then glued with M-bond 610 to the polished side of the disk.

Noise Characteristics and Thermal Decay in Single-layer Perpendicular Recording Media

1998 ◽  
Vol 22 (S_3_PMRS_98) ◽  
pp. S3_5-8
Author(s):  
Y. Hirayama ◽  
Y. Honda ◽  
K. Ito ◽  
T. Takeuchi ◽  
M. Futamoto
Keyword(s):  
Single Layer ◽  
Recording Media ◽  
Thermal Decay ◽  
Perpendicular Recording ◽  
Noise Characteristics

Noise Characterization of InAs Based Composite Channel DG -MOSHEMT with Different Gate Dielectrics

Silicon ◽  
2021 ◽  
Author(s):  
G. Sujatha ◽  
N. Mohankumar ◽  
R. Poornachandran ◽  
R. Saravana Kumar ◽  
Girish Shankar Mishra ◽  
...  
Keyword(s):  
Gate Dielectrics ◽  
Composite Channel ◽  
Noise Characterization

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization
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