scholarly journals Dependence of exchange coupling in permalloy/Cr82Al18 bilayers on the constituent layer thickness

2000 ◽  
Vol 87 (9) ◽  
pp. 6659-6661 ◽  
Author(s):  
S. M. Zhou ◽  
Kai Liu ◽  
C. L. Chien
Keyword(s):  
Layer Thickness ◽  
Exchange Coupling ◽  
Constituent Layer

scholarly journals Magnetic layer thickness dependence of the interlayer exchange coupling in (001) Co/Cu/Co

1994 ◽  
Vol 72 (5) ◽  
pp. 764-767 ◽  
Author(s):  
P. J. H. Bloemen ◽  
M. T. Johnson ◽  
M. T. H. van de Vorst ◽  
R. Coehoorn ◽  
J. J. de Vries ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Exchange Coupling ◽  
Magnetic Layer ◽  
Thickness Dependence ◽  
Interlayer Exchange Coupling ◽  
Interlayer Exchange

Spacer layer thickness dependence of exchange coupling in Co-enriched Co-Mn-Si/Cr/Co-Mn-Si epitaxial trilayers

2011 ◽  
Vol 110 (11) ◽  
pp. 113901 ◽  
Author(s):  
S. Bosu ◽  
Y. Sakuraba ◽  
K. Saito ◽  
H. Wang ◽  
K. Takanashi
Keyword(s):  
Layer Thickness ◽  
Exchange Coupling ◽  
Thickness Dependence ◽  
Spacer Layer Thickness ◽  
Spacer Layer

Oscillatory Interlayer Exchange Coupling with the Cu Cap Layer Thickness in Co/Cu/Co/Cu(100)

1995 ◽  
Vol 75 (23) ◽  
pp. 4306-4309 ◽  
Author(s):  
J. J. de Vries ◽  
A. A. P. Schudelaro ◽  
R. Jungblut ◽  
P. J. H. Bloemen ◽  
A. Reinders ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Exchange Coupling ◽  
Interlayer Exchange Coupling ◽  
Cap Layer ◽  
Interlayer Exchange

scholarly journals Magnetic layer thickness dependence of the interlayer exchange coupling in (001) Co/Cu/Co

1994 ◽  
Vol 76 (10) ◽  
pp. 7081-7083 ◽  
Author(s):  
P. J. H. Bloemen ◽  
M. T. H. van de Vorst ◽  
M. T. Johnson ◽  
R. Coehoorn ◽  
W. J. M. de Jonge
Keyword(s):  
Layer Thickness ◽  
Exchange Coupling ◽  
Magnetic Layer ◽  
Thickness Dependence ◽  
Interlayer Exchange Coupling ◽  
Interlayer Exchange

The Influence of Si on Magnetic and Magneto-Optical Properties of Co/Si/Co Thin-Film Systems

2015 ◽  
Vol 233-234 ◽  
pp. 653-656 ◽  
Author(s):  
Elena E. Shalygina ◽  
Elena A. Gan’shina ◽  
Anna M. Kharlamova ◽  
Aleksander N. Mukhin ◽  
Galina V. Kurlyandskaya ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Properties ◽  
Magnetron Sputtering ◽  
Layer Thickness ◽  
Exchange Coupling ◽  
Structural Features ◽  
Magnetic Saturation ◽  
Antiferromagnetic Exchange ◽  
Saturation Field ◽  
Magnetic Layers

The magnetic and magneto-optical properties of the Co/Si/Co thin-film samples obtained by magnetron sputtering were investigated employing magnetooptical techniques. The thickness of the Co layers was equal to 5 nm, and Si layer thickness varied in the interval of 0.2 to 3.2 nm. The magnetic saturation field of the samples under study was found to oscillate in the magnitude with the change of the Si layer thickness. This result was explained by structural features of the Co/Si/Co multilayers and the presence of the antiferromagnetic exchange coupling between magnetic layers via the silicon interlayer. The peculiarities of the magneto-optical spectra of the Co/Si/Co samples were measured and discussed.

Comparative investigation of strength and plastic instability in Cu/Au and Cu/Cr multilayers by indentation

2009 ◽  
Vol 24 (3) ◽  
pp. 728-735 ◽  
Author(s):  
Y.P. Li ◽  
X.F. Zhu ◽  
J. Tan ◽  
B. Wu ◽  
W. Wang ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Mechanical Response ◽  
Plastic Instability ◽  
Comparative Investigation ◽  
Individual Layer ◽  
Confining Effect ◽  
Significant Difference ◽  
Deformation Instability ◽  
Interface Structures ◽  
Constituent Layer

The mechanical response to indentation (including nano- and microindentation) has been investigated in Cu/Au and Cu/Cr multilayers with respective layer thickness ratios of 1:1 and 2:1, and individual layer thickness ranging from nanometer to submicrometer scale. It was found that the Cu/Cr multilayer has higher strength than the Cu/Au multilayer, although both multilayers have close Hall–Petch slope. Examination of indentation-induced deformation behavior shows that the Cu/Cr multilayer exhibits higher resistance to plastic deformation instability than the Cu/Au multilayer. Theoretical analysis indicates that the significant difference in mechanical response originates from the constituent layer configuration and interface structures, which impose distinguishing confining effect on dislocation activity.

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