Measurement of stacking fault densities in CoCrPt thin film media using grazing incidence x-ray scattering

2000 ◽  
Vol 87 (9) ◽  
pp. 5690-5692 ◽  
Author(s):  
L. Holloway ◽  
H. Laidler
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Stacking Fault ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Grazing-incidence X-ray scattering of lamellar thin films

2019 ◽  
Vol 52 (2) ◽  
pp. 247-251
Author(s):  
Detlef-M. Smilgies
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Small Molecules ◽  
Film Studies ◽  
Grazing Incidence ◽  
Semicrystalline Polymers ◽  
X Ray ◽  
X Ray Scattering ◽  
Incident Plane ◽  
Ray Scattering

Recently, surface and thin-film studies using area detectors have become prevalent. An important class of such systems are lamellar thin films formed by small molecules, liquid crystals or semicrystalline polymers. Frequently, the lamellae align more or less parallel to the substrate. Such structures can be easily discerned by their characteristic X-ray scattering close to the incident plane. This paper describes how such patterns can be simulated, in order to extract morphological information about the thin film.

scholarly journals Characterization of Lipid-Templated Silica and Hybrid Thin Film Mesophases by Grazing Incidence Small-Angle X-ray Scattering

Langmuir ◽  
2009 ◽  
Vol 25 (16) ◽  
pp. 9500-9509 ◽  
Author(s):  
Darren R. Dunphy ◽  
Todd M. Alam ◽  
Michael P. Tate ◽  
Hugh W. Hillhouse ◽  
Bernd Smarsly ◽  
...  
Keyword(s):  
Thin Film ◽  
Small Angle ◽  
Grazing Incidence ◽  
Hybrid Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Depth Profiling of Molybdenum Thin Films Using Grazing Incidence X-Ray Scattering

1993 ◽  
Vol 317 ◽  
Author(s):  
Sandra G. Malhotra ◽  
Z. Rek ◽  
M. Vill ◽  
O.P. Karpenko ◽  
S.M. Yalisove ◽  
...  
Keyword(s):  
Thin Film ◽  
Depth Profiling ◽  
Grazing Incidence ◽  
Lattice Parameter ◽  
Three Dimensions ◽  
X Ray ◽  
X Ray Scattering ◽  
Average Change ◽  
Principal Strains ◽  
Ray Scattering

ABSTRACTIt is important that inherent strains (or stresses) be controlled during thin film processing. This study used grazing incidence x-ray scattering (G1XS) to determine the strain gradient present in a ∼1700 Å sputtered molybdenum thin film. In particular, the gradient in the hydrostatic strain was Measured. This observation corresponded to assessing the average change in the lattice parameter as a function of depth throughout the thickness of the film. In addition, the strain ellipsoids, which represent the state of strain in three dimensions, were calculated as a function of film depth. It was shown that the strain varied throughout the ∼1700 Å Mo film thickness and that the principal strains were anisotropic, with one principal strain much larger than the others in Magnitude.

Structural study of a low dielectric thin film using X-ray reflectivity and grazing incidence small angle X-ray scattering

2005 ◽  
Vol 472 (1-2) ◽  
pp. 323-327 ◽  
Author(s):  
C.-H. Hsu ◽  
U-Ser Jeng ◽  
Hsin-Yi Lee ◽  
Chih-Mon Huang ◽  
K.S. Liang ◽  
...  
Keyword(s):  
Thin Film ◽  
Structural Study ◽  
Small Angle ◽  
Grazing Incidence ◽  
Dielectric Thin Film ◽  
X Ray ◽  
Low Dielectric ◽  
X Ray Scattering ◽  
Ray Scattering

Resonant Grazing-Incidence Small-Angle X-ray Scattering at the Sulfur K-Edge for Material-Specific Investigation of Thin-Film Nanostructures

2018 ◽  
Vol 9 (11) ◽  
pp. 3081-3086 ◽  
Author(s):  
Mihael Coric ◽  
Nitin Saxena ◽  
Mika Pflüger ◽  
Peter Müller-Buschbaum ◽  
Michael Krumrey ◽  
...  
Keyword(s):  
Thin Film ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Thin Film Nanostructures ◽  
Ray Scattering

Grazing-incidence small-angle X-ray scattering: new tool for studying thin film growth

1989 ◽  
Vol 22 (6) ◽  
pp. 528-532 ◽  
Author(s):  
J. R. Levine ◽  
J. B. Cohen ◽  
Y. W. Chung ◽  
P. Georgopoulos
Keyword(s):  
Thin Film ◽  
Small Angle ◽  
Film Growth ◽  
Grazing Incidence ◽  
Thin Film Growth ◽  
Synchrotron Source ◽  
X Ray ◽  
X Ray Scattering ◽  
Sampling Statistics ◽  
Ray Scattering

Grazing-incidence small-angle X-ray scattering (GISAXS) is introduced as a method of studying discontinuous thin films. In this method, the incident beam is totally externally reflected from the substrate followed by small-angle scattering of the refracted beam by the thin film. The experiment described establishes the ability of GISAXS to provide size information for islands formed in the initial stages of thin film growth. The data presented are for gold films of 7 and 15 Å average thicknesses on Corning 7059 glass substrates. The advantages of this technique are that it is non-destructive, can be done in situ, provides excellent sampling statistics, does not necessarily require a synchrotron source, and is not limited to thin or conducting substrates.

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