scholarly journals Characterization of Lipid-Templated Silica and Hybrid Thin Film Mesophases by Grazing Incidence Small-Angle X-ray Scattering

Langmuir ◽  
2009 ◽  
Vol 25 (16) ◽  
pp. 9500-9509 ◽  
Author(s):  
Darren R. Dunphy ◽  
Todd M. Alam ◽  
Michael P. Tate ◽  
Hugh W. Hillhouse ◽  
Bernd Smarsly ◽  
...  
Keyword(s):  
Thin Film ◽  
Small Angle ◽  
Grazing Incidence ◽  
Hybrid Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

Structural study of a low dielectric thin film using X-ray reflectivity and grazing incidence small angle X-ray scattering

2005 ◽  
Vol 472 (1-2) ◽  
pp. 323-327 ◽  
Author(s):  
C.-H. Hsu ◽  
U-Ser Jeng ◽  
Hsin-Yi Lee ◽  
Chih-Mon Huang ◽  
K.S. Liang ◽  
...  
Keyword(s):  
Thin Film ◽  
Structural Study ◽  
Small Angle ◽  
Grazing Incidence ◽  
Dielectric Thin Film ◽  
X Ray ◽  
Low Dielectric ◽  
X Ray Scattering ◽  
Ray Scattering

Resonant Grazing-Incidence Small-Angle X-ray Scattering at the Sulfur K-Edge for Material-Specific Investigation of Thin-Film Nanostructures

2018 ◽  
Vol 9 (11) ◽  
pp. 3081-3086 ◽  
Author(s):  
Mihael Coric ◽  
Nitin Saxena ◽  
Mika Pflüger ◽  
Peter Müller-Buschbaum ◽  
Michael Krumrey ◽  
...  
Keyword(s):  
Thin Film ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Thin Film Nanostructures ◽  
Ray Scattering

Grazing-incidence small-angle X-ray scattering: new tool for studying thin film growth

1989 ◽  
Vol 22 (6) ◽  
pp. 528-532 ◽  
Author(s):  
J. R. Levine ◽  
J. B. Cohen ◽  
Y. W. Chung ◽  
P. Georgopoulos
Keyword(s):  
Thin Film ◽  
Small Angle ◽  
Film Growth ◽  
Grazing Incidence ◽  
Thin Film Growth ◽  
Synchrotron Source ◽  
X Ray ◽  
X Ray Scattering ◽  
Sampling Statistics ◽  
Ray Scattering

Grazing-incidence small-angle X-ray scattering (GISAXS) is introduced as a method of studying discontinuous thin films. In this method, the incident beam is totally externally reflected from the substrate followed by small-angle scattering of the refracted beam by the thin film. The experiment described establishes the ability of GISAXS to provide size information for islands formed in the initial stages of thin film growth. The data presented are for gold films of 7 and 15 Å average thicknesses on Corning 7059 glass substrates. The advantages of this technique are that it is non-destructive, can be done in situ, provides excellent sampling statistics, does not necessarily require a synchrotron source, and is not limited to thin or conducting substrates.

Characterization of Mo/Si soft X-ray multilayer mirrors by grazing-incidence small-angle X-ray scattering

Vacuum ◽  
2009 ◽  
Vol 84 (1) ◽  
pp. 19-25 ◽  
Author(s):  
P. Siffalovic ◽  
E. Majkova ◽  
L. Chitu ◽  
M. Jergel ◽  
S. Luby ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Multilayer Mirrors ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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