scholarly journals Characterization of all-chromium tunnel junctions and single-electron tunneling devices fabricated by direct-writing multilayer technique

1999 ◽  
Vol 86 (12) ◽  
pp. 6956-6964 ◽  
Author(s):  
H. Scherer ◽  
Th. Weimann ◽  
P. Hinze ◽  
B. W. Samwer ◽  
A. B. Zorin ◽  
...  
2013 ◽  
Vol 108 ◽  
pp. 1-4 ◽  
Author(s):  
Jingyue Fang ◽  
Shiqiao Qin ◽  
Xueao Zhang ◽  
Fei Wang ◽  
Zhengzheng Shao ◽  
...  

2000 ◽  
Vol 284-288 ◽  
pp. 1806-1807
Author(s):  
Hansjörg Scherer ◽  
Thomas Weimann ◽  
Peter Hinze ◽  
Ben W. Samwer ◽  
Alexander B. Zorin ◽  
...  

1999 ◽  
Vol 60 (17) ◽  
pp. 12246-12255 ◽  
Author(s):  
B. R. Bułka ◽  
J. Martinek ◽  
G. Michałek ◽  
J. Barnaś

1992 ◽  
Vol 61 (6) ◽  
pp. 1871-1874 ◽  
Author(s):  
Akinobu Kanda ◽  
Shingo Katsumoto ◽  
Fumio Komori ◽  
Shun-ichi Kobayashi

1995 ◽  
Vol 66 (3) ◽  
pp. 305-307 ◽  
Author(s):  
E. H. Visscher ◽  
S. M. Verbrugh ◽  
J. Lindeman ◽  
P. Hadley ◽  
J. E. Mooij

1997 ◽  
Vol 46 (2) ◽  
pp. 303-306 ◽  
Author(s):  
H. Wolf ◽  
F.J. Ahlers ◽  
J. Niemeyer ◽  
H. Scherer ◽  
T. Weimann ◽  
...  

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