Surface chemistries and electronic properties of molecular semiconductor thin films grown by effusion beams

1988 ◽  
Author(s):  
P. Lee ◽  
J. Pankow ◽  
J. Danziger ◽  
K. W. Nebesny ◽  
N. R. Armstrong
1998 ◽  
Vol 102 (23) ◽  
pp. 4516-4525 ◽  
Author(s):  
John C. Conboy ◽  
Eric J. C. Olson ◽  
David M. Adams ◽  
Josef Kerimo ◽  
Arie Zaban ◽  
...  

2014 ◽  
Vol 5 (1) ◽  
Author(s):  
Michele Serri ◽  
Wei Wu ◽  
Luke R. Fleet ◽  
Nicholas M. Harrison ◽  
Cyrus F. Hirjibehedin ◽  
...  

2009 ◽  
pp. 35-60
Author(s):  
H. Brinkmann ◽  
C. Kelting ◽  
S. Makarov ◽  
O. Tsaryova ◽  
G. Schnurpfeil ◽  
...  

2008 ◽  
Vol 205 (3) ◽  
pp. 409-420 ◽  
Author(s):  
H. Brinkmann ◽  
C. Kelting ◽  
S. Makarov ◽  
O. Tsaryova ◽  
G. Schnurpfeil ◽  
...  

2018 ◽  
Author(s):  
Weikun Zhu ◽  
Erfan Mohammadi ◽  
Ying Diao

Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried out via image analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then employ this program in a case study of meniscus-guided coating of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C<sub>8</sub>-BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C<sub>8</sub>-BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms.


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