High-resolution x-ray and transmission electron microscopic analysis of a GaInAsSb/AlGaAsSb multiple quantum well laser structure

1999 ◽  
Vol 85 (11) ◽  
pp. 7664-7670 ◽  
Author(s):  
A. L. Gray ◽  
T. C. Newell ◽  
L. F. Lester ◽  
H. Lee
Keyword(s):  
Multiple Quantum Well ◽  
Microscopic Analysis ◽  
Multiple Quantum ◽  
Electron Microscopic ◽  
X Ray ◽  
Quantum Well Laser ◽  
Transmission Electron ◽  
Transmission Electron Microscopic ◽  
Transmission Electron Microscopic Analysis ◽  
Multiple Quantum Well Laser

High Temperature MOVPE Growth of AlxGa1−xN (0.2-1) Layers on Sapphire and SiC Substrates for the Fabrication Deep UV Optical Devices

2006 ◽  
Vol 955 ◽  
Author(s):  
Balakrishnan Krishnan ◽  
Masataka Imura ◽  
Kazuyoshi Iida ◽  
Kentaro Nagamatsu ◽  
Hiroki Sugimura ◽  
...  
Keyword(s):  
High Temperature ◽  
Microscopic Analysis ◽  
Dislocation Loops ◽  
X Ray Diffraction ◽  
Electron Microscopic ◽  
X Ray ◽  
Transmission Electron ◽  
Dislocation Densities ◽  
Transmission Electron Microscopic ◽  
Transmission Electron Microscopic Analysis

ABSTRACTSingle crystalline AlN epitaxial layers have been grown on and (0001) sapphire and 6H-SiC substrates by MOVPE technique at high temperatures in the range of 1340-1500°C. The structural qualities of the high temperature grown AlN layers were found to be good as evidenced by X-ray diffraction analyses results. By transmission electron microscopic analysis, dislocation densities of the layers were found to be 6.2 × 107 cm−2 or lower and the formation of dislocation loops was confirmed. High temperature bridge layers of AlN and AlxGa1−xN layers were grown on linear-groove patterned sapphire based AlN templates and 6H-SiC substrates. AlxGa1−xN bridge layers exhibited different growth behaviours depending on the direction of groove patterns on the sub-strates.

The number of moults in the egg of sealworm, Pseudoterranova decipiens (Nematoda: Ascaridoidea): an ultrastructural study

1995 ◽  
Vol 52 (S1) ◽  
pp. 156-160 ◽  
Author(s):  
Lena N. Measures ◽  
Henry Hong
Keyword(s):  
Sea Water ◽  
Microscopic Analysis ◽  
Electron Microscopic ◽  
Free Living ◽  
Second Stage ◽  
Ultrastructural Evidence ◽  
Pseudoterranova Decipiens ◽  
Transmission Electron ◽  
Transmission Electron Microscopic ◽  
Transmission Electron Microscopic Analysis

The number of moults in the egg of sealworm, Pseudoterranova decipiens (Nematoda: Ascaridoidea), and other ascaridoids is contentious. Transmission electron microscopic analysis of eggs and free-living larvae of sealworm confirmed that only one moult occurs in the egg. The first-stage larval (L1) cuticle on embryos was first observed in eggs incubated at 15 °C in sea water on day 5 after eggs were dissected from the uterus of sealworm obtained from the stomach of grey seals. There was no ecdysis of this L1 cuticle. A second cuticle began to form beneath the L1 cuticle between day 5 and 12. The second-stage larval (L2) cuticle continued to develop and on day 12 the L2 larva hatched enclosed within the cuticle of the first stage. The L1 cuticle appeared to be partially resorbed during development of the L2 cuticle. This study provides the first ultrastructural evidence of the number of moults that occur in eggs of sealworm.

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