High-resolution transmission electron microscopic analysis of porous silicon∕silicon interface

2004 ◽  
Vol 85 (13) ◽  
pp. 2517-2519 ◽  
Author(s):  
R. J. Martín-Palma ◽  
L. Pascual ◽  
A. Landa ◽  
P. Herrero ◽  
J. M. Martínez-Duart
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