Investigation of optical properties of interfaces between heavily doped Al0.48In0.52As:Si and InP (Fe) substrates by photoreflectance analysis
1983 ◽
Vol 44
(C3)
◽
pp. C3-345-C3-348
2020 ◽
Vol 543
◽
pp. 120149
◽
1985 ◽
Vol 117
(1)
◽
pp. 267-274
◽