Contribution of interface roughness to the infrared spectra of thermally grown silicon dioxide films
Keyword(s):
2005 ◽
Vol 22
(5-6)
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pp. 201-204
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1962 ◽
Vol 109
(3)
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pp. 221
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Keyword(s):
1999 ◽
Vol 508
(1-3)
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pp. 87-96
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1973 ◽
Vol 120
(11)
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pp. 1582
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Keyword(s):
1993 ◽
Vol 140
(3)
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pp. 797-800
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1967 ◽
Vol 18
(1)
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pp. 23-27
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