Electron beam induced changes in the refractive index and film thickness of amorphous AsxS100−x and AsxSe100−x films

1998 ◽  
Vol 84 (11) ◽  
pp. 6055-6058 ◽  
Author(s):  
Olli Nordman ◽  
Nina Nordman ◽  
Nasser Peyghambarian
Keyword(s):  
Refractive Index ◽  
Electron Beam ◽  
Film Thickness ◽  
Induced Changes

Photo- and thermally induced changes in the refractive index and film thickness of amorphous As2S8 film

2008 ◽  
Vol 103 (12) ◽  
pp. 123523 ◽  
Author(s):  
L. E. Zou ◽  
B. X. Chen ◽  
L. P. Du ◽  
H. Hamanaka ◽  
M. Iso
Keyword(s):  
Refractive Index ◽  
Film Thickness ◽  
Thermally Induced ◽  
Induced Changes

The method of replication affects metal film granularity and resolution

1989 ◽  
Vol 47 ◽  
pp. 708-709
Author(s):  
George C. Ruben
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Film Thickness ◽  
Single Molecule ◽  
Metal Film ◽  
Vertical Surface ◽  
High Resolution Imaging ◽  
Controllable Factors ◽  
Resolution Imaging

Single molecule resolution in electron beam sensitive, uncoated, noncrystalline materials has been impossible except in thin Pt-C replicas ≤ 150Å) which are resistant to the electron beam destruction. Previously the granularity of metal film replicas limited their resolution to ≥ 20Å. This paper demonstrates that Pt-C film granularity and resolution are a function of the method of replication and other controllable factors. Low angle 20° rotary , 45° unidirectional and vertical 9.7±1 Å Pt-C films deposited on mica under the same conditions were compared in Fig. 1. Vertical replication had a 5A granularity (Fig. 1c), the highest resolution (table), and coated the whole surface. 45° replication had a 9Å granulartiy (Fig. 1b), a slightly poorer resolution (table) and did not coat the whole surface. 20° rotary replication was unsuitable for high resolution imaging with 20-25Å granularity (Fig. 1a) and resolution 2-3 times poorer (table). Resolution is defined here as the greatest distance for which the metal coat on two opposing faces just grow together, that is, two times the apparent film thickness on a single vertical surface.

scholarly journals Effect of Silver Oxide Film Thickness on Some Optical Parameter

2014 ◽  
Vol 11 (2) ◽  
pp. 690-694
Author(s):  
Baghdad Science Journal
Keyword(s):  
Dielectric Constant ◽  
Refractive Index ◽  
Oxide Film ◽  
Film Thickness ◽  
Silver Oxide ◽  
Optical Parameter ◽  
Oxide Film Thickness ◽  
Chemical Spray ◽  
Transmission And Absorption ◽  
Different Thickness

Films of silver oxide of different thickness have been prepared by the chemical spray paralysis. Transmission and absorption spectra have recorded in order to study the effect of increasing thickness on some optical parameter such as reflectance, refractive index , and dielectric constant in its two parts . This study reveals that all these paramters affect by increasing the thickness .

Influence of Seawater Refractive Index on the Precision of Oil Film Thickness Measurement by Differential Laser Triangulation

2015 ◽  
Vol 42 (4) ◽  
pp. 0408004
Author(s):  
耿云飞 Geng Yunfei ◽  
陈曦 Chen Xi ◽  
金文 Jin Wen ◽  
张惠群 Zhang Huiqun ◽  
邬海强 Wu Haiqiang ◽  
...  
Keyword(s):  
Refractive Index ◽  
Film Thickness ◽  
Thickness Measurement ◽  
Laser Triangulation ◽  
Oil Film ◽  
Film Thickness Measurement

Effect of electron beam evaporation process parameters on infrared refractive index of Ge film

2020 ◽  
Vol 16 (4) ◽  
pp. 298-302
Author(s):  
Kun Li ◽  
Yu-qing Xiong ◽  
Hu Wang ◽  
Kai-feng Zhang ◽  
Ling-mao Xu ◽  
...  
Keyword(s):  
Refractive Index ◽  
Electron Beam ◽  
Process Parameters ◽  
Electron Beam Evaporation ◽  
Evaporation Process
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