Intrinsic and extrinsic surface states of single crystalline SrTiO3

1998 ◽  
Vol 84 (4) ◽  
pp. 2123-2126 ◽  
Author(s):  
Yuji Adachi ◽  
Shigemi Kohiki ◽  
Kazuaki Wagatsuma ◽  
Masaoki Oku
Keyword(s):  
Surface States ◽  
Single Crystalline

Healing of Surface States and Point Defects in Single-Crystalline  -Ga2O3 Epilayer

2012 ◽  
Vol 45 (7) ◽  
pp. 79-84 ◽  
Author(s):  
P. Ravadgar ◽  
R.-H. Horng ◽  
T. Y. Wang
Keyword(s):  
Point Defects ◽  
Surface States ◽  
Single Crystalline

scholarly journals Thermoelectric Characteristics of A Single-Crystalline Topological Insulator Bi2Se3 Nanowire

Nanomaterials ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 819
Author(s):  
Dedi ◽  
Ping-Chung Lee ◽  
Pai-Chun Wei ◽  
Yang-Yuan Chen
Keyword(s):  
Thermoelectric Properties ◽  
Figure Of Merit ◽  
Surface States ◽  
Volume Ratio ◽  
Single Crystalline ◽  
Transmission Electron ◽  
Growth Method ◽  
Spin Orbit Interactions ◽  
Good Agreement ◽  
Strong Spin

The discovery of topological insulators (TIs) has motivated detailed studies on their physical properties, especially on their novel surface states via strong spin–orbit interactions. However, surface-state-related thermoelectric properties are rarely reported, likely because of the involvement of their bulk-dominating contribution. In this work, we report thermoelectric studies on a TI bismuth selenide (Bi2Se3) nanowire (NW) that exhibit a larger surface/volume ratio. Uniform single-crystalline TI Bi2Se3 NWs were successfully synthesized using a stress-induced growth method. To achieve the study of the thermoelectric properties of a nanowire (NW), including electrical conductivity (σ), Seebeck coefficient (S), and thermal conductivity (κ), a special platform for simultaneously performing all measurements on a single wire was designed. The properties of σ, S, and κ of a 200 nm NW that was well precharacterized using transmission electron microscope (TEM) measurements were determined using the four-probe method, the two-probe EMF across ∇T measurement, and the 3ω technique, respectively. The integrated TE properties represented by the figure of merit ZT (S2σT/κ) were found to be in good agreement with a theoretical study of Bi2Se3 NW.

Zero-loss omega-filtered REM and RHEED on the new Zeiss 912

1991 ◽  
Vol 49 ◽  
pp. 616-617
Author(s):  
J.C.H. Spence ◽  
J. Mayer
Keyword(s):  
Electron Microscopy ◽  
Materials Science ◽  
Surface States ◽  
Ccd Camera ◽  
Dark Field ◽  
Ion Pump ◽  
Magnetic Imaging ◽  
Reflection Electron Microscopy ◽  
Diffraction Patterns ◽  
Large Background

The Zeiss 912 is a new fully digital, side-entry, 120 Kv TEM/STEM instrument for materials science, fitted with an omega magnetic imaging energy filter. Pumping is by turbopump and ion pump. The magnetic imaging filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient parallel (area) detection. The energy loss intensity distribution may also be displayed on the screen, and recorded by scanning it over the PMT supplied. If a CCD camera is fitted and suitable new software developed, “parallel ELS” recording results. For large fields of view, filtered images can be recorded much more efficiently than by Scanning Reflection Electron Microscopy, and the large background of inelastic scattering removed. We have therefore evaluated the 912 for REM and RHEED applications. Causes of streaking and resonance in RHEED patterns are being studied, and a more quantitative analysis of CBRED patterns may be possible. Dark field band-gap REM imaging of surface states may also be possible.

“Preparation of Single Crystalline Gold Films for ED Studies”

1972 ◽  
Vol 30 ◽  
pp. 634-635
Author(s):  
Joseph D. C. Peng
Keyword(s):  
Crystal Morphology ◽  
Diffraction Theory ◽  
Scattering Matrix ◽  
Vacuum Evaporation ◽  
Gold Films ◽  
Matrix Formulation ◽  
Silver Films ◽  
Single Crystalline ◽  
Grating Pattern ◽  
Stacking Disorder

The relative intensities of the ED spots in a cross-grating pattern can be calculated using N-beam electron diffraction theory. The scattering matrix formulation of N-beam ED theory has been previously applied to imperfect microcrystals of gold containing stacking disorder (coherent twinning) in the (111) crystal plane. In the present experiment an effort has been made to grow single-crystalline, defect-free (111) gold films of a uniform and accurately know thickness using vacuum evaporation techniques. These represent stringent conditions to be met experimentally; however, if a meaningful comparison is to be made between theory and experiment, these factors must be carefully controlled. It is well-known that crystal morphology, perfection, and orientation each have pronounced effects on relative intensities in single crystals.The double evaporation method first suggested by Pashley was employed with some modifications. Oriented silver films of a thickness of about 1500Å were first grown by vacuum evaporation on freshly cleaved mica, with the substrate temperature at 285° C during evaporation with the deposition rate at 500-800Å/sec.

Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer

2013 ◽  
Vol 58 (2) ◽  
pp. 142-150 ◽  
Author(s):  
A.V. Sachenko ◽  
◽  
V.P. Kostylev ◽  
V.G. Litovchenko ◽  
V.G. Popov ◽  
...  
Keyword(s):  
Surface Layer ◽  
Crystalline Silicon ◽  
Silicon Wafers ◽  
Single Crystalline Silicon ◽  
Near Surface ◽  
Single Crystalline
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