298 K operation of Nb/Nb oxide-based single-electron transistors with reduced size of tunnel junctions by thermal oxidation
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1999 ◽
Vol 17
(4)
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pp. 1413
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2001 ◽
Vol 25
(4−2)
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pp. 783-786
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2016 ◽
Vol 34
(1)
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pp. 01A122
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