Simulation of Electron Tunnel Current through HfO[sub 2]∕SiO[sub 2] Nanometer-thick Layers with a Trapped Charge of a MOS Capacitor Using a Transfer-Matrix Method
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2010 ◽
Vol 31
(12)
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pp. 124002
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2021 ◽
Vol 1885
(5)
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pp. 052069
2006 ◽
Vol 73
(1)
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pp. 53-60
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1994 ◽
Vol 116
(3)
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pp. 309-317
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