Erratum: “A quantitative analysis of surface deformation by stick/slip atomic force microscopy” [J. Appl. Phys. 82, 3763 (1997)]

J. Kerssemakers; J. Th. M. De Hosson

doi:10.1063/1.366589

Erratum: “A quantitative analysis of surface deformation by stick/slip atomic force microscopy” [J. Appl. Phys. 82, 3763 (1997)]

Journal of Applied Physics ◽

10.1063/1.366589 ◽

1998 ◽

Vol 83 (6) ◽

pp. 3444-3444 ◽

Cited By ~ 2

Author(s):

J. Kerssemakers ◽

J. Th. M. De Hosson

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Analysis ◽

Surface Deformation ◽

Stick Slip ◽

Force Microscopy ◽

Atomic Force

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A quantitative analysis of surface deformation by stick/slip atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.366541 ◽

1997 ◽

Vol 82 (8) ◽

pp. 3763-3770 ◽

Cited By ~ 7

Author(s):

J. Kerssemakers ◽

J. Th. M. De Hosson

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Analysis ◽

Surface Deformation ◽

Stick Slip ◽

Force Microscopy ◽

Atomic Force

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Quantitative Analysis of Montmorillonite Platelet Size by Atomic Force Microscopy

Industrial & Engineering Chemistry Research ◽

10.1021/ie051392r ◽

2006 ◽

Vol 45 (21) ◽

pp. 7025-7034 ◽

Cited By ~ 118

Author(s):

Harry J. Ploehn ◽

Chunyan Liu

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Analysis ◽

Force Microscopy ◽

Atomic Force ◽

Platelet Size

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Quantitative Analysis of Drug-Induced Complement-Mediated Cytotoxic Effect on Single Tumor Cells Using Atomic Force Microscopy and Fluorescence Microscopy

IEEE Transactions on NanoBioscience ◽

10.1109/tnb.2014.2370759 ◽

2015 ◽

Vol 14 (1) ◽

pp. 84-94 ◽

Cited By ~ 17

Author(s):

Mi Li ◽

Lianqing Liu ◽

Ning Xi ◽

Yuechao Wang ◽

Xiubin Xiao ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Analysis ◽

Fluorescence Microscopy ◽

Tumor Cells ◽

Cytotoxic Effect ◽

Drug Induced ◽

Force Microscopy ◽

Atomic Force ◽

Single Tumor

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In situobservation of surface deformation of polymer films by atomic force microscopy

Review of Scientific Instruments ◽

10.1063/1.1150585 ◽

2000 ◽

Vol 71 (5) ◽

pp. 2094-2096 ◽

Cited By ~ 22

Author(s):

Takashi Nishino ◽

Akiko Nozawa ◽

Masaru Kotera ◽

Katsuhiko Nakamae

Keyword(s):

Atomic Force Microscopy ◽

Polymer Films ◽

Surface Deformation ◽

Force Microscopy ◽

Atomic Force

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Stretched polymer surfaces: Atomic force microscopy measurement of the surface deformation and surface elastic properties of stretched polyethylene

Journal of Polymer Science Part B Polymer Physics ◽

10.1002/polb.1200 ◽

2001 ◽

Vol 39 (19) ◽

pp. 2263-2274 ◽

Cited By ~ 33

Author(s):

A. Opdahl ◽

G. A. Somorjai

Keyword(s):

Atomic Force Microscopy ◽

Elastic Properties ◽

Surface Deformation ◽

Polymer Surfaces ◽

Atomic Force Microscopy Measurement ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Measurement

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Line Scan Reconstruction: A Viable Approach for Tracking Atomic Stick–Slip Events and True Tip Position in Atomic Force Microscopy

Tribology Letters ◽

10.1007/s11249-016-0761-0 ◽

2016 ◽

Vol 64 (2) ◽

Cited By ~ 1

Author(s):

Quanzhou Yao ◽

Qunyang Li

Keyword(s):

Atomic Force Microscopy ◽

Stick Slip ◽

Force Microscopy ◽

Line Scan ◽

Atomic Force ◽

Tip Position ◽

Viable Approach

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Demonstration of atomic scale stick-slip events stimulated by the force versus distance mode using atomic force microscopy

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/35/16/324 ◽

2002 ◽

Vol 35 (16) ◽

pp. 2066-2074 ◽

Cited By ~ 10

Author(s):

Gregory S Watson ◽

Bradley P Dinte ◽

Jolanta A Blach ◽

Sverre Myhra

Keyword(s):

Atomic Force Microscopy ◽

Atomic Scale ◽

Stick Slip ◽

Force Microscopy ◽

Atomic Force

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Evolution of surface deformation during fatigue of PH 13-8 Mo stainless steel using atomic force microscopy

Fatigue & Fracture of Engineering Materials & Structures ◽

10.1046/j.1460-2695.2002.00499.x ◽

2002 ◽

Vol 25 (3) ◽

pp. 305-314 ◽

Cited By ~ 15

Author(s):

L. Cretegny ◽

A. Saxena

Keyword(s):

Atomic Force Microscopy ◽

Stainless Steel ◽

Surface Deformation ◽

Force Microscopy ◽

Atomic Force

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Quantitative analysis of electrodeposited tin film morphologies by atomic force microscopy

Thin Solid Films ◽

10.1016/j.tsf.2004.04.051 ◽

2005 ◽

Vol 471 (1-2) ◽

pp. 76-85 ◽

Cited By ~ 35

Author(s):

T. Jiang ◽

N. Hall ◽

A. Ho ◽

S. Morin

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Analysis ◽

Force Microscopy ◽

Atomic Force ◽

Tin Film

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An approach for quantitative analysis of pore size distribution of silica gel using atomic force microscopy

International Journal of Refrigeration ◽

10.1016/j.ijrefrig.2018.08.017 ◽

2019 ◽

Vol 105 ◽

pp. 72-79 ◽

Cited By ~ 1

Author(s):

M.L. Palash ◽

Sourav Mitra ◽

Sivasankaran Harish ◽

Kyaw Thu ◽

Bidyut Baran Saha

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Analysis ◽

Pore Size Distribution ◽

Pore Size ◽

Size Distribution ◽

Silica Gel ◽

Force Microscopy ◽

Atomic Force

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