scholarly journals In situobservation of surface deformation of polymer films by atomic force microscopy

2000 ◽  
Vol 71 (5) ◽  
pp. 2094-2096 ◽  
Author(s):  
Takashi Nishino ◽  
Akiko Nozawa ◽  
Masaru Kotera ◽  
Katsuhiko Nakamae
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Films ◽  
Surface Deformation ◽  
Force Microscopy ◽  
Atomic Force

Nanomechanical Probing of Layered Nanoscale Polymer Films With Atomic Force Microscopy

2004 ◽  
Vol 19 (3) ◽  
pp. 716-728 ◽  
Author(s):  
A. Kovalev ◽  
H. Shulha ◽  
M. Lemieux ◽  
N. Myshkin ◽  
V.V. Tsukruk
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Films ◽  
Elastic Moduli ◽  
Solid Substrate ◽  
Elastic Solids ◽  
Polymer Layers ◽  
Transition Zones ◽  
Force Microscopy ◽  
Microstructural Parameters ◽  
Atomic Force

The approach developed for the microindentation of layered elastic solids was adapted to analyze atomic force microscopy probing of ultrathin (1–100 nm-thick) polymer films on a solid substrate. The model for analyzing microindentation of layered solids was extended to construct two- and tri-step graded functions with the transition zones accounting for a variable gradient between layers. This “graded” approach offered a transparent consideration of the gradient of the mechanical properties between layers. Several examples of recent applications of this model to nanoscale polymer layers were presented. We considered polymer layers with elastic moduli ranging from 0.05 to 3000 MPa with different architecture in a dry state and in a solvated state. The most sophisticated case of a tri-layered polymer film with thickness of 20–50 nm was also successfully treated within this approach. In all cases, a complex shape of corresponding loading curves and elastic modulus depth profiles obtained from experimental data were fitted by the graded functions with nanomechanical parameters (elastic moduli and transition zone widths) close to independently determined microstructural parameters (thickness and composition of layers) of the layered materials.

Visualization of Focused Proton Beam Dose Distribution by Atomic Force Microscopy Using Blended Polymer Films Based on Polyacrylic Acid

2012 ◽  
Vol 12 (9) ◽  
pp. 7401-7404 ◽  
Author(s):  
Masaaki Omichi ◽  
Katsuyoshi Takano ◽  
Takahiro Satoh ◽  
Tomihiro Kamiya ◽  
Yasuyuki Ishii ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Proton Beam ◽  
Polymer Films ◽  
Polyacrylic Acid ◽  
Dose Distribution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Blended Polymer ◽  
Beam Dose

scholarly journals Swelling, dewetting and breakup in thin polymer films for cultural heritage

Soft Matter ◽  
2020 ◽  
Vol 16 (6) ◽  
pp. 1485-1497
Author(s):  
Amélie Castel ◽  
Philipp Gutfreund ◽  
Bernard Cabane ◽  
Yahya Rharbi
Keyword(s):  
Atomic Force Microscopy ◽  
Cultural Heritage ◽  
Binary Mixtures ◽  
Polymer Films ◽  
Amorphous Polymer ◽  
Neutron Reflectometry ◽  
Thin Polymer Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Thin Polymer

The removal of ultrathin amorphous polymer films in contact with nonsolvent/solvent binary mixtures is addressed by means of neutron reflectometry and atomic force microscopy.

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