Hot carrier effects in AlGaAs/InGaAs high electron mobility transistors: Failure mechanisms induced by hot carrier testing

1997 ◽  
Vol 82 (11) ◽  
pp. 5547-5554 ◽  
Author(s):  
Gaudenzio Meneghesso ◽  
Alvise Mion ◽  
Youcef Haddab ◽  
Maura Pavesi ◽  
Manfredo Manfredi ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Failure Mechanisms ◽  
High Electron Mobility Transistors ◽  
Carrier Testing ◽  
High Electron ◽  
High Electron Mobility ◽  
Hot Carrier ◽  
Electron Mobility Transistors ◽  
Hot Carrier Effects

Hot Carrier Stress Effects of SiO2 Passivated AlGaN/GaN High Electron Mobility Transistors

2019 ◽  
Vol 3 (5) ◽  
pp. 213-220 ◽  
Author(s):  
Min-Woo Ha ◽  
Young-Hwan Choi ◽  
Joon-Hyun Park ◽  
Kwang-Seok Seo ◽  
Min-Koo Han
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Hot Carrier ◽  
Stress Effects ◽  
Electron Mobility Transistors ◽  
Hot Carrier Stress

Theory of hot-carrier-induced phenomena in GaN high-electron-mobility transistors

2010 ◽  
Vol 96 (5) ◽  
pp. 053505 ◽  
Author(s):  
Y. S. Puzyrev ◽  
B. R. Tuttle ◽  
R. D. Schrimpf ◽  
D. M. Fleetwood ◽  
S. T. Pantelides
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Hot Carrier ◽  
Electron Mobility Transistors

Role of bias conditions in the hot carrier degradation of AlGaN/GaN high electron mobility transistors

2013 ◽  
Vol 10 (5) ◽  
pp. 794-798 ◽  
Author(s):  
Shubhajit Mukherjee ◽  
Yevgeny Puzyrev ◽  
John Hinckley ◽  
Ronald D. Schrimpf ◽  
Daniel M. Fleetwood ◽  
...  
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Hot Carrier ◽  
Electron Mobility Transistors ◽  
Hot Carrier Degradation

(Invited) Electric-Field and Thermally-Activated Failure Mechanisms of AlGaN/GaN High Electron Mobility Transistors

2019 ◽  
Vol 41 (8) ◽  
pp. 237-249 ◽  
Author(s):  
Enrico Zanoni ◽  
Gaudenzio Meneghesso ◽  
Matteo Meneghini ◽  
Antonio Stocco ◽  
Fabiana Rampazzo ◽  
...  
Keyword(s):  
Electric Field ◽  
Electron Mobility ◽  
Failure Mechanisms ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
High Electron Mobility ◽  
Thermally Activated ◽  
Electron Mobility Transistors
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