Effect of SiOH and SiCl on ArF-excimer laser-induced absorption in soot-remelted silica

1997 ◽  
Vol 81 (12) ◽  
pp. 8011-8017 ◽  
Author(s):  
Nobu Kuzuu ◽  
Toshiyuki Taga ◽  
Naoyoshi Kamisugi
Keyword(s):  
Excimer Laser ◽  
Induced Absorption ◽  
Arf Excimer Laser

KrF- and ArF-excimer-laser-induced absorption in silica glasses produced by melting synthetic silica powder

2013 ◽  
Vol 114 (1) ◽  
pp. 014902 ◽  
Author(s):  
Nobu Kuzuu ◽  
Toshiya Sasaki ◽  
Tatsuya Kojima ◽  
Jun-ichiro Tanaka ◽  
Takayuki Nakamura ◽  
...  
Keyword(s):  
Excimer Laser ◽  
Silica Powder ◽  
Induced Absorption ◽  
Silica Glasses ◽  
Arf Excimer Laser

Influence of sodium impurities on ArF excimer-laser-induced absorption in CaF_2 crystals

2000 ◽  
Vol 39 (22) ◽  
pp. 3925 ◽  
Author(s):  
Norio Komine ◽  
Shigeru Sakuma ◽  
Masaki Shiozawa ◽  
Tsutomu Mizugaki ◽  
Eiji Sato
Keyword(s):  
Excimer Laser ◽  
Induced Absorption ◽  
Arf Excimer Laser

High Resolution Displacement of Functional Groups onto Fluorocarbon Resin Surface by Using ArF Excimer Laser

1996 ◽  
Vol 451 ◽  
Author(s):  
T. Shimizu ◽  
M. Murahara
Keyword(s):  
Contact Angle ◽  
High Resolution ◽  
Laser Beam ◽  
Thin Layer ◽  
Functional Groups ◽  
Excimer Laser ◽  
Laser Fluence ◽  
Large Area ◽  
Three Solutions ◽  
Arf Excimer Laser

ABSTRACTA Fluorocarbon resin surface was selectively modified by irradiation with a ArF laser beam through a thin layer of NaAlO2, B(OH)3, or H2O solution to give a hydrophilic property. As a result, with low fluence, the surface was most effectively modified with the NaAlO2 solution among the three solutions. However, the contact angle in this case changed by 10 degrees as the fluence changed only 1mJ/cm2. When modifying a large area of the surface, high resolution displacement could not be achieved because the laser beam was not uniform in displacing functional groups. Thus, the laser fluence was successfully made uniform by homogenizing the laser beam; the functional groups were replaced on the fluorocarbon resin surface with high resolution, which was successfully modified to be hydrophilic by distributing the laser fluence uniformly.

Characterization of GaAs surfaces treated with phosphine gas photodecomposed by an ArF excimer laser

1998 ◽  
Vol 72 (12) ◽  
pp. 1472-1474 ◽  
Author(s):  
Takashi Sugino ◽  
Hideaki Ninomiya ◽  
Junji Shirafuji ◽  
Koichiro Matsuda
Keyword(s):  
Excimer Laser ◽  
Arf Excimer Laser
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