Comparison between direct current and sinusoidal current stressing of gate oxides and oxide/silicon interfaces in metal–oxide–silicon field-effect transistors

L. Trabzon; O. O. Awadelkarim; J. Werking; G. Bersuker; Y. D. Chan

doi:10.1063/1.363892

Comparison between direct current and sinusoidal current stressing of gate oxides and oxide/silicon interfaces in metal–oxide–silicon field-effect transistors

Journal of Applied Physics ◽

10.1063/1.363892 ◽

1997 ◽

Vol 81 (3) ◽

pp. 1575-1580 ◽

Cited By ~ 5

Author(s):

L. Trabzon ◽

O. O. Awadelkarim ◽

J. Werking ◽

G. Bersuker ◽

Y. D. Chan

Keyword(s):

Metal Oxide ◽

Direct Current ◽

Field Effect ◽

Field Effect Transistors ◽

Gate Oxides ◽

Current Stressing ◽

Sinusoidal Current ◽

Metal Oxide Silicon

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Electrical-stress simulation of plasma-damage to submicron metal–oxide–silicon field-effect transistors: Comparison between direct current and alternating current stresses

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580803 ◽

1997 ◽

Vol 15 (3) ◽

pp. 692-696 ◽

Cited By ~ 2

Author(s):

L. Trabzon ◽

O. O. Awadelkarim

Keyword(s):

Metal Oxide ◽

Direct Current ◽

Field Effect ◽

Field Effect Transistors ◽

Alternating Current ◽

Plasma Damage ◽

Electrical Stress ◽

Metal Oxide Silicon ◽

Stress Simulation

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Correlation between Charge Pumping Method and Direct-Current Current Voltage Method in p-Type Metal-Oxide-Semiconductor Field-Effect Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.38.4696 ◽

1999 ◽

Vol 38 (Part 1, No. 8) ◽

pp. 4696-4698 ◽

Cited By ~ 6

Author(s):

Bin-Bin Jie ◽

Kok-Hooi Ng ◽

Ming-Fu Li ◽

Keng-Foo Lo

Keyword(s):

Metal Oxide ◽

Direct Current ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Charge Pumping ◽

Current Voltage ◽

P Type

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Reduction of Radiation-Induced Degradation in n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFET's) with Gate Oxides Prepared by Repeated Rapid Thermal $\bf N_{2}O$ Annealing

Japanese Journal of Applied Physics ◽

10.1143/jjap.33.l916 ◽

1994 ◽

Vol 33 (Part 2, No. 7A) ◽

pp. L916-L917 ◽

Cited By ~ 1

Author(s):

You-Lin Wu ◽

Kang-Min Kuo ◽

Jenn-Gwo Hwu

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Gate Oxides ◽

Radiation Induced

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Effect of the bulk charge on the thermal noise in metal-oxide-silicon field-effect transistors

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1965.15594 ◽

1965 ◽

Vol 12 (9) ◽

pp. 509-509

Author(s):

C.T. Sah ◽

F.H. Hielscher ◽

S.Y. Wu

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Thermal Noise ◽

Field Effect Transistors ◽

Bulk Charge ◽

Metal Oxide Silicon

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THE FABRICATION AND CHARACTERIZATION OF METAL-OXIDE-SILICON CAPACITORS AND FIELD-EFFECT TRANSISTORS USING Dy2O3 AND Sm2O3 GATE DIELECTRICS

Integrated Ferroelectrics ◽

10.1080/10584580802088892 ◽

2008 ◽

Vol 97 (1) ◽

pp. 111-120 ◽

Cited By ~ 4

Author(s):

Yu-Ren Hwang ◽

Ingram Yin-ku Chang ◽

Ming-tsong Wang ◽

Joseph Ya-min Lee

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Gate Dielectrics ◽

Field Effect Transistors ◽

Fabrication And Characterization ◽

Metal Oxide Silicon

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Trap evaluations of metal/oxide/silicon field-effect transistors with high-k gate dielectric using charge pumping method

Applied Physics Letters ◽

10.1063/1.1506776 ◽

2002 ◽

Vol 81 (11) ◽

pp. 2050-2052 ◽

Cited By ~ 21

Author(s):

Ga-Won Lee ◽

Jae-Hee Lee ◽

Hae-Wang Lee ◽

Myoung-Kyu Park ◽

Dae-Gwan Kang ◽

...

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Gate Dielectric ◽

Field Effect Transistors ◽

Charge Pumping ◽

High K ◽

Metal Oxide Silicon ◽

High K Gate Dielectric

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Identification of the atomic-scale defects involved in the negative bias temperature instability in plasma-nitrided p-channel metal-oxide-silicon field-effect transistors

Journal of Applied Physics ◽

10.1063/1.2844348 ◽

2008 ◽

Vol 103 (4) ◽

pp. 044505 ◽

Cited By ~ 31

Author(s):

J. P. Campbell ◽

P. M. Lenahan ◽

A. T. Krishnan ◽

S. Krishnan

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Atomic Scale ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Metal Oxide Silicon

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Damage to sub-half-micron metal-oxide-silicon field-effect transistors from plasma processing of low- k polymer interlayer dielectrics

Semiconductor Science and Technology ◽

10.1088/0268-1242/15/4/301 ◽

2000 ◽

Vol 15 (4) ◽

pp. 309-314 ◽

Cited By ~ 3

Author(s):

L Trabzon ◽

O O Awadelkarim

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Plasma Processing ◽

Interlayer Dielectrics ◽

Metal Oxide Silicon ◽

Low K

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Low Contact Resistivity with Low Silicide/p+-Silicon Schottky Barrier for High-Performance p-Channel Metal–Oxide–Silicon Field Effect Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.04da03 ◽

2010 ◽

Vol 49 (4) ◽

pp. 04DA03 ◽

Cited By ~ 7

Author(s):

Hiroaki Tanaka ◽

Tatsunori Isogai ◽

Tetsuya Goto ◽

Akinobu Teramoto ◽

Shigetoshi Sugawa ◽

...

Keyword(s):

Metal Oxide ◽

Schottky Barrier ◽

Field Effect ◽

High Performance ◽

Field Effect Transistors ◽

Contact Resistivity ◽

Metal Oxide Silicon

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Dependence of the performance and reliability of n-metal-oxide-silicon field effect transistors on interlayer dielectric processing

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.590896 ◽

1999 ◽

Vol 17 (5) ◽

pp. 2216 ◽

Cited By ~ 1

Author(s):

L. Trabzon ◽

O. O. Awadelkarim ◽

J. Werking

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Interlayer Dielectric ◽

Metal Oxide Silicon

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