Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring

2011 ◽  
Vol 82 (9) ◽  
pp. 094902
Author(s):  
J. Altet ◽  
D. Mateo ◽  
X. Perpiñà ◽  
S. Grauby ◽  
S. Dilhaire ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Temperature Sensing ◽  
Circuit Testing ◽  
Integrated Circuit Testing ◽  
Sensing Systems

scholarly journals 3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing

2011 ◽  
Vol 19 (23) ◽  
pp. 22594 ◽  
Author(s):  
K. Shao ◽  
A. Morisset ◽  
V. Pouget ◽  
E. Faraud ◽  
C. Larue ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Photon Absorption ◽  
Knife Edge ◽  
Circuit Testing ◽  
Two Photon Absorption ◽  
Two Photon ◽  
Integrated Circuit Testing

MIRAGE read-in integrated circuit testing results

1999 ◽  
Author(s):  
Theodore R. Hoelter ◽  
Blake A. Henry ◽  
John H. Graff ◽  
Naseem Y. Aziz
Keyword(s):  
Integrated Circuit ◽  
Circuit Testing ◽  
Integrated Circuit Testing
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