Chemical structure study of SiO2/4H-SiC (0001) interface transition region by angle-dependent x-ray photoelectron spectroscopy

2011 ◽  
Vol 99 (8) ◽  
pp. 082102 ◽  
Author(s):  
Qiaozhi Zhu ◽  
Lingqin Huang ◽  
Wenbo Li ◽  
Shenmin Li ◽  
Dejun Wang
Keyword(s):  
Transition Region ◽  
Photoelectron Spectroscopy ◽  
Chemical Structure ◽  
Structure Study ◽  
X Ray

A Two-step Electrodeposition of Pd-Cu/Cu2O Nanocomposite on FTO Substrate for Non-enzymatic Hydrogen Peroxide Sensor

2021 ◽  
Vol 17 ◽  
Author(s):  
Ke Huan ◽  
Li Tang ◽  
Dongmei Deng ◽  
Huan Wang ◽  
Xiaojing Si ◽  
...  
Keyword(s):  
Hydrogen Peroxide ◽  
Cyclic Voltammetry ◽  
Photoelectron Spectroscopy ◽  
Chemical Structure ◽  
Pd Nanoparticles ◽  
Optimal Conditions ◽  
Potential Oscillation ◽  
X Ray Diffraction ◽  
X Ray

Background: Hydrogen peroxide (H2O2) is a common reagent in the production and living, but excessive H2O2 may enhance the danger to the human body. Consequently, it is very important to develop economical, fast and accurate techniques for detecting H2O2. Methods: A simple two-step electrodeposition process was applied to synthesize Pd-Cu/Cu2O nanocomposite for non-enzymatic H2O2 sensor. Cu/Cu2O nanomaterial was firstly electrodeposited on FTO by potential oscillation technique, and then Pd nanoparticles were electrodeposited on Cu/Cu2O nanomaterial by cyclic voltammetry. The chemical structure, component, and morphology of the synthesized Pd-Cu/Cu2O nanocomposite were characterized by X-ray diffraction, scanning electron microscopy and X-ray photoelectron spectroscopy. The electrochemical properties of Pd-Cu/Cu2O nanocomposite were studied by cyclic voltammetry and amperometry. Results: Under optimal conditions, the as-fabricated sensor displayed a broad linear range (5-4000 µM) and low detection limit (1.8 µM) for the determination of H2O2. The proposed sensor showed good selectivity and reproducibility. Meanwhile, the proposed sensor has been successfully applied to detect H2O2 in milk. Conclusion: The Pd-Cu/Cu2O/FTO biosensor exhibits excellent electrochemical activity for H2O2 reduction, which has great potential application in the field of food safety.

Chemical Structure of Native Oxide Grown on Hydrogenterminated Silicon Surfaces

1992 ◽  
Vol 259 ◽  
Author(s):  
M. Takakura ◽  
T. Yasaka ◽  
S. Miyazaki ◽  
M. Hirose
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Structure ◽  
Pure Water ◽  
Silicon Surfaces ◽  
Native Oxide ◽  
Appreciable Amount ◽  
X Ray ◽  
Thermal Oxide ◽  
Phonon Peak ◽  
Strained Bonds

ABSTRACTChemical bonding features and suboxide compositions in native oxide grown on chemically-cleaned hydrogen-terminated Si(100) surfaces stored in pure water have been studied by using surface sensitive infrared spectroscopy and x-ray photoelectron spectroscopy. The LO phonon peak for the native oxide is located at 1210cm−1, which is shifted to a significantly lower wavenumber side than the ultrathin thermal oxide peak at 1250cm−1. This is because an appreciable amount of SiHx bonds are incorporated in the native oxide/Si interface and such hydrogen termination in the network dramatically reduces strained bonds in the interface. Very weak Si2+ suboxide signal from the oxide grown in pure water is also explained by the incorporated SiHx bonds which interrupt the Si2+ suboxide formation in the interface.

scholarly journals The Preparation and Chemical Structure Analysis of Novel POSS-Based Porous Materials

Materials ◽  
2019 ◽  
Vol 12 (12) ◽  
pp. 1954 ◽  
Author(s):  
Xiaomei Yang ◽  
Guangzhong Yin ◽  
Zhiyong Li ◽  
Pengfei Wu ◽  
Xiaopei Jin ◽  
...  
Keyword(s):  
Porous Materials ◽  
Photoelectron Spectroscopy ◽  
Chemical Structure ◽  
Preparation Method ◽  
X Ray Diffraction ◽  
Related Research ◽  
X Ray ◽  
Advantages And Disadvantages ◽  
Solvent Water ◽  
Oligomeric Silsesquioxane

In this work, we reported the preparation and chemical analysis of novel polyhedral oligomeric silsesquioxane (POSS)-based porous materials, which were prepared according to Friedel-Crafts chloromethylation by using aluminum chloride as the catalyst and dichloromethane as the solvent. Through controlling the treatment solvent (water or methanol) and kinds of POSS, several materials with different morphologies were conveniently obtained. The chemical structure of porous materials was systematically characterized by Fourier-transform infrared (FTIR) spectra, 29Si Nuclear Magnetic Resonance (NMR), 13C NMR, and X-ray photoelectron spectroscopy (XPS). The samples were further characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and thermogravimetric analysis (TGA) to study their crystallinity, morphology, and thermal properties, respectively. The work systematically demonstrated the chemical structure of the porous materials. Moreover, the advantages and disadvantages of the preparation method and typical properties of the material were evaluated through a comparative analysis with other related research works.

Chemical structure of films grown by AlN laser ablation: an X-ray photoelectron spectroscopy study

1999 ◽  
Vol 122 (2-3) ◽  
pp. 242-246 ◽  
Author(s):  
N. Laidani ◽  
L. Vanzetti ◽  
M. Anderle ◽  
A. Basillais ◽  
C. Boulmer-Leborgne ◽  
...  
Keyword(s):  
Laser Ablation ◽  
Photoelectron Spectroscopy ◽  
Chemical Structure ◽  
Spectroscopy Study ◽  
X Ray

Band alignment and interfacial chemical structure of the HfLaO/InGaZnO4 heterojunction investigated by x-ray photoelectron spectroscopy

2017 ◽  
Vol 50 (14) ◽  
pp. 145106 ◽  
Author(s):  
Ling-Xuan Qian ◽  
Ze-Han Wu ◽  
Yi-Yu Zhang ◽  
Yuan Liu ◽  
Jia-Qi Song ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Structure ◽  
Band Alignment ◽  
X Ray

Composition and Chemical Structure of Nitrided Silica Gel

1984 ◽  
Vol 32 ◽  
Author(s):  
R. K. Brow ◽  
C. G. Pantano
Keyword(s):  
Thin Films ◽  
Infrared Spectroscopy ◽  
Low Temperature ◽  
Silica Gel ◽  
Photoelectron Spectroscopy ◽  
Chemical Structure ◽  
Sol Gel ◽  
X Ray ◽  
Higher Temperature ◽  
Low Temperature Treatments

ABSTRACTSol/gel derived silica thin films were thermally treated in NH3 for four hours at temperatures up to 1300C. The films were analyzed by ellipsometry, X-ray photoelectron spectroscopy (XPS) and infrared spectroscopy (IR). Over 30 mol% nitrogen was incorporated in the film treated at 1300C. Using IR and XPS analyses, -NHx groups were found to be present after low temperature treatments, while nitrogen was incorporated in an oxynitride structure after the higher temperature treatments.

Chemical structure of polypyrrole: X-ray photoelectron spectroscopy of polypyrrole with 5-yliden-3-pyrrolin-2-one end groups

Polymer ◽  
1991 ◽  
Vol 32 (4) ◽  
pp. 728-732 ◽  
Author(s):  
Josep M. Ribó ◽  
Amadou Dicko ◽  
Josep M. Tura ◽  
D. Bloor
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Structure ◽  
X Ray ◽  
End Groups
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