The effect of the trap density and depth on the current bistability in organic bistable devices

2011 ◽  
Vol 110 (4) ◽  
pp. 043721 ◽  
Author(s):  
Jae Hun Jung ◽  
Tae Whan Kim
Keyword(s):  
Trap Density ◽  
Organic Bistable Devices

Dependence of the trap density and the distribution on the current bistability in organic bistable devices

2011 ◽  
Vol 11 (2) ◽  
pp. e40-e43 ◽  
Author(s):  
Chan Ho You ◽  
Jae Hun Jung ◽  
Jin Ku Kwak ◽  
Tae Whan Kim
Keyword(s):  
Trap Density ◽  
Organic Bistable Devices

Two-Dimensional Local Deep-Level Transient Spectroscopy Imaging Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy

2016 ◽  
Author(s):  
N. Chinone ◽  
Y. Cho ◽  
R. Kosugi ◽  
Y. Tanaka ◽  
S. Harada ◽  
...  
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Higher Order ◽  
Trap Density ◽  
New Technique ◽  
Two Dimensional ◽  
Nonlinear Dielectric ◽  
Annealing Conditions ◽  
Transient Spectroscopy ◽  
A New Technique

Abstract A new technique for local deep level transient spectroscopy (DLTS) imaging using super-higher-order scanning nonlinear dielectric microscopy is proposed. Using this technique. SiCVSiC structure samples with different post oxidation annealing conditions were measured. We observed that the local DLTS signal decreases with post oxidation annealing (POA), which agrees with the well-known phenomena that POA reduces trap density. Furthermore, obtained local DLTS images had dark and bright areas, which is considered to show the trap distribution at/near SiCVSiC interface.

Analyzing the interface trap density in SiGe capacitors using an abnormal flat band voltage shift at low temperature

2020 ◽  
Vol 13 (11) ◽  
pp. 111006
Author(s):  
Li-Chuan Sun ◽  
Chih-Yang Lin ◽  
Po-Hsun Chen ◽  
Tsung-Ming Tsai ◽  
Kuan-Ju Zhou ◽  
...  
Keyword(s):  
Low Temperature ◽  
Trap Density ◽  
Flat Band ◽  
Interface Trap Density ◽  
Interface Trap ◽  
Flat Band Voltage ◽  
Voltage Shift

scholarly journals Impact of dopant species on the interfacial trap density and mobility in amorphous In-X-Zn-O solution-processed thin-film transistors

2014 ◽  
Vol 115 (21) ◽  
pp. 214501 ◽  
Author(s):  
Mohammed Benwadih ◽  
J. A. Chroboczek ◽  
Gérard Ghibaudo ◽  
Romain Coppard ◽  
Dominique Vuillaume
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Trap Density ◽  
Solution Processed

An Electron Acceptor Analogue for Lowering Trap Density in Organic Solar Cells

2021 ◽  
pp. 2008134
Author(s):  
Yihang Zhang ◽  
Guilong Cai ◽  
Yawen Li ◽  
Zhenzhen Zhang ◽  
Tengfei Li ◽  
...  
Keyword(s):  
Solar Cells ◽  
Electron Acceptor ◽  
Organic Solar Cells ◽  
Trap Density

Detection of Border Trap Density and Energy Distribution Along the Gate Dielectric Bulk of High-$\kappa$ Gated MOS Devices

2007 ◽  
Vol 28 (5) ◽  
pp. 432-435 ◽  
Author(s):  
Chun-Yuan Lu ◽  
Kuei-Shu Chang-Liao ◽  
Chun-Chang Lu ◽  
Ping-Hung Tsai ◽  
Tien-Ko Wang
Keyword(s):  
Energy Distribution ◽  
Gate Dielectric ◽  
Trap Density ◽  
Mos Devices
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