Excess carrier lifetime and ambipolar diffusion anisotropy in a nipi‐doped In0.2Ga0.8As/GaAs multiple‐quantum‐well structure

1996 ◽  
Vol 79 (9) ◽  
pp. 7014-7020 ◽  
Author(s):  
H. T. Lin ◽  
D. H. Rich ◽  
A. Larsson
1995 ◽  
Vol 379 ◽  
Author(s):  
H.T. Lin ◽  
D.H. Rich ◽  
A. Larsson

ABSTRACTThe effects of strain-induced defects on excess carrier lifetime and transport in a nipi-doped In0.2Ga0.8As/GaAs multiple quantum well (MQW) structure were examined with a new method called electron beam-induced absorption modulation (EBIA) in which the kinetics of carrier transport and recombination are examined with a high-spatial, -spectral and -temporal resolution. The excess carrier lifetime and ambipolar diffusion were found to be reduced by factors of ∼1013 and ∼103 compared to theoretical values, respectively, and this is attributed to the presence of strain-induced defects. The MQW excitonic absorption coefficient sensitively depends on the carrier density in the QWs, as a result of screening of the electron-hole (e-h) Coulombic interaction. Likewise, ambipolar diffusion is found to depend on the excess carrier density in a nonlinear fashion, as a result of the e-h plasma-induced changes in the local depletion widths in the vicinity of structural defects.


1997 ◽  
Vol 71 (5) ◽  
pp. 647-649 ◽  
Author(s):  
Daniel X. Zhu ◽  
Serge Dubovitsky ◽  
William H. Steier ◽  
Johan Burger ◽  
Denis Tishinin ◽  
...  

1996 ◽  
Vol 27 (1) ◽  
pp. 87-92
Author(s):  
P.M. Nikolić ◽  
Z. Ristovski ◽  
S. Đurić ◽  
V. Blagojević ◽  
M.D. Dramićanin ◽  
...  

1995 ◽  
Vol 182-184 ◽  
pp. 455-458 ◽  
Author(s):  
P.J. Boyce ◽  
D. Wolverson ◽  
J.J. Davies ◽  
W. Heimbrodt

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