scholarly journals Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment

2011 ◽  
Vol 82 (7) ◽  
pp. 073703 ◽  
Author(s):  
S. Rode ◽  
R. Stark ◽  
J. Lübbe ◽  
L. Tröger ◽  
J. Schütte ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Frequency Modulation ◽  
Low Noise ◽  
Liquid Environment ◽  
Force Microscopy ◽  
Atomic Force

High-Resolution Frequency-Modulation Atomic Force Microscopy in Liquids Using Electrostatic Excitation Method

2010 ◽  
Vol 3 (6) ◽  
pp. 065205 ◽  
Author(s):  
Ken-ichi Umeda ◽  
Noriaki Oyabu ◽  
Kei Kobayashi ◽  
Yoshiki Hirata ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Frequency Modulation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Excitation Method

Frequency modulation detection atomic force microscopy in the liquid environment

2001 ◽  
Vol 72 (S1) ◽  
pp. S129-S132 ◽  
Author(s):  
S.P. Jarvis ◽  
T. Ishida ◽  
T. Uchihashi ◽  
Y. Nakayama ◽  
H. Tokumoto
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Liquid Environment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modulation Detection ◽  
Frequency Modulation Detection

A Study of Dark Currents on Various Modified Surfaces of Mercuric Iodide Single Crystals

1993 ◽  
Vol 302 ◽  
Author(s):  
H. N. Jayatirtha ◽  
M. Azoulay ◽  
M.A. George ◽  
A. Burger
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Surface Modifications ◽  
Low Noise ◽  
Mercuric Iodide ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modified Surfaces ◽  
Dark Currents

ABSTRACTThe surface modifications that occur on °-mercuric iodide surfaces during the fabrication process are crucial for the development of a low noise, high resolution X-ray spectrometer. In this study, we discuss the effects of surface treatments on the dark currents and the results are correlated with surface morphology studies that were carried out by the atomic force microscopy (AFM) technique.

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