Vanadium related near‐band‐edge absorption bands in three SiC polytypes

1995 ◽  
Vol 78 (5) ◽  
pp. 3160-3163 ◽  
Author(s):  
J. R. Jenny ◽  
M. Skowronski ◽  
W. C. Mitchel ◽  
H. M. Hobgood ◽  
R. C. Glass ◽  
...  
1996 ◽  
Vol 80 (7) ◽  
pp. 4045-4048 ◽  
Author(s):  
Srinivasan Krishnamurthy ◽  
A.‐B. Chen ◽  
A. Sher

1995 ◽  
Vol 66 (19) ◽  
pp. 2534-2536 ◽  
Author(s):  
C. Le Berre ◽  
C. Corbel ◽  
R. Mih ◽  
M. R. Brozel ◽  
S. Tüzemen ◽  
...  

1995 ◽  
Vol 34 (Part 1, No. 1) ◽  
pp. 42-47 ◽  
Author(s):  
Gwo-Cherng Jiang ◽  
Yih Chang ◽  
Liann-Be Chang ◽  
Yung-Der Juang ◽  
SuLu

1996 ◽  
Vol 79 (11) ◽  
pp. 8682-8687 ◽  
Author(s):  
R. A. Hogg ◽  
K. Takahei ◽  
A. Taguchi

2002 ◽  
Vol 91 (12) ◽  
pp. 9827 ◽  
Author(s):  
M. Germain ◽  
E. Kartheuser ◽  
A. L. Gurskii ◽  
E. V. Lutsenko ◽  
I. P. Marko ◽  
...  

1992 ◽  
Vol 281 ◽  
Author(s):  
Yang Zuoya ◽  
B. L. Weiss ◽  
G. Shao ◽  
F. Namavar

ABSTRACTThe effect of the Si:Ge ratio in SiGe/Si heterostructures on the structural and optical properties of SiGe/Si planar waveguide are reported here for Ge concentrations from 1 to 33.6%. The high propagation loss at 1.15 pm is due to band edge absorption, which increases as the Ge concentration increases, while the loss at longer wavelengths (1.523 pm) increases with decreasing Si concentration, due to the reduced optical confinement of the waveguide structure.


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