Relationship between Q-factor and sample damping for contact resonance atomic force microscope measurement of viscoelastic properties

2011 ◽  
Vol 109 (11) ◽  
pp. 113528 ◽  
Author(s):  
P. A. Yuya ◽  
D. C. Hurley ◽  
J. A. Turner
Keyword(s):  
Atomic Force Microscope ◽  
Viscoelastic Properties ◽  
Q Factor ◽  
Atomic Force ◽  
Atomic Force Microscope Measurement ◽  
Contact Resonance

Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale

2013 ◽  
Vol 21 (6) ◽  
pp. 18-24 ◽  
Author(s):  
Eoghan Dillon ◽  
Kevin Kjoller ◽  
Craig Prater
Keyword(s):  
Viscoelastic Properties ◽  
Contact Stiffness ◽  
Mechanical And Thermal Properties ◽  
Resonance Modes ◽  
Atomic Force ◽  
Resonance Frequencies ◽  
Other Information ◽  
Afm Cantilever ◽  
Stiffness And Damping ◽  
Contact Resonance

Atomic force microscopy (AFM) has been widely used in both industry and academia for imaging the surface topography of a material with nanoscale resolution. However, often little other information is obtained. Contact resonance AFM (CR-AFM) is a technique that can provide information about the viscoelastic properties of a material in contact with an AFM probe by measuring the contact stiffness between the probe and sample. In CR-AFM, an AFM cantilever is oscillated, and the amplitude and frequency of the resonance modes of the cantilever are monitored. When a probe or sample is oscillated, the tip sample interaction can be approximated as an ideal spring-dashpot system using the Voigt-Kelvin model shown in Figure 1. Contact resonance frequencies of the AFM cantilever will shift depending on the contact stiffness, k, between the tip and sample. The damping effect on the system comes from dissipative tip sample forces such as viscosity and adhesion. Damping, η, is observed in a CR-AFM system by monitoring the amplitude and Q factor of the resonant modes of the cantilever. This contact stiffness and damping information can then be used to obtain information about the viscoelastic properties of the material when fit to an applicable model.

A Plate-Like Sensor for the Identification of Sample Viscoelastic Properties Using Contact Resonance Atomic Force Microscopy

2021 ◽  
pp. 1-9
Author(s):  
Matteo Aureli ◽  
Ryan Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Viscoelastic Properties ◽  
Ritz Method ◽  
Theoretical Derivation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modal Damping ◽  
Stiffness And Damping ◽  
Data Estimation ◽  
Contact Resonance

Abstract In this paper, we present a new contact resonance atomic force microscopy based method utilizing a square, plate-like microsensor to accurately estimate viscoelastic sample properties. A theoretical derivation, based on Rayleigh-Ritz method and on an “unconventional” generalized eigenvalue problem, is presented and a numerical experiment is devised to verify the method. We present an updated sensitivity criterion that allows users, given a set of measured in-contact eigenfrequencies and modal damping ratios, to select the best eigenfrequency for accurate data estimation. The verification results are then presented and discussed. Results show that the proposed method performs extremely well in the identification of viscoelastic properties over broad ranges of non-dimensional sample stiffness and damping values.

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

scholarly journals Measuring the viscoelastic properties of human platelets with the atomic force microscope

1996 ◽  
Vol 70 (1) ◽  
pp. 556-567 ◽  
Author(s):  
M. Radmacher ◽  
M. Fritz ◽  
C.M. Kacher ◽  
J.P. Cleveland ◽  
P.K. Hansma
Keyword(s):  
Atomic Force Microscope ◽  
Viscoelastic Properties ◽  
Human Platelets ◽  
Atomic Force

Viscoelastic Properties of Single Polysaccharide Molecules Determined by Analysis of Thermally Driven Oscillations of an Atomic Force Microscope Cantilever

Langmuir ◽  
2004 ◽  
Vol 20 (21) ◽  
pp. 9299-9303 ◽  
Author(s):  
Masaru Kawakami ◽  
Katherine Byrne ◽  
Bhavin Khatri ◽  
Tom C. B. Mcleish ◽  
Sheena E. Radford ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Viscoelastic Properties ◽  
Atomic Force Microscope Cantilever ◽  
Atomic Force ◽  
Thermally Driven ◽  
Force Microscope Cantilever

Continuous Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy

Small ◽  
2011 ◽  
Vol 7 (8) ◽  
pp. 1018-1022 ◽  
Author(s):  
Jason P. Killgore ◽  
Roy H. Geiss ◽  
Donna C. Hurley
Keyword(s):  
Atomic Force Microscope ◽  
Continuous Measurement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Contact Resonance
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