Characterization of deep level defects in thermally annealed Fe‐doped semi‐insulating InP by thermally stimulated current spectroscopy
1998 ◽
Vol 27
(2)
◽
pp. 62-68
◽
Keyword(s):
2008 ◽
Vol 19
(S1)
◽
pp. 281-284
◽
Keyword(s):