Gate- and drain-lag effects in (Mg,Zn)O-based metal-semiconductor field-effect transistors

2011 ◽  
Vol 109 (7) ◽  
pp. 074515 ◽  
Author(s):  
F. J. Klüpfel ◽  
A. Lajn ◽  
H. Frenzel ◽  
H. von Wenckstern ◽  
M. Grundmann
2008 ◽  
Author(s):  
Takafumi Uemura ◽  
Masakazu Yamagishi ◽  
Yukihiro Tominari ◽  
Jun Takeya

2008 ◽  
Author(s):  
M. Uno ◽  
I. Doi ◽  
K. Takimiya ◽  
Jun Takeya

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